Observations on the range and effects of charge in insulators - implications for x-ray microanalysis and imaging

Brendan Griffin, C.E. Nockolds

Research output: Chapter in Book/Conference paperConference paper

Original languageEnglish
Title of host publicationElectron Microscopy 1998
EditorsH.A. Calderon Benavides
Place of PublicationBristol
PublisherInstitute of Physics Publishing
Pages359
Volume1
EditionCancun, Mexico
ISBN (Print)07503-0569 X
Publication statusPublished - 1998
EventObservations on the range and effects of charge in insulators - implications for x-ray microanalysis and imaging - Cancun, Mexico
Duration: 1 Jan 1998 → …

Conference

ConferenceObservations on the range and effects of charge in insulators - implications for x-ray microanalysis and imaging
Period1/01/98 → …

Cite this

Griffin, B., & Nockolds, C. E. (1998). Observations on the range and effects of charge in insulators - implications for x-ray microanalysis and imaging. In H. A. C. Benavides (Ed.), Electron Microscopy 1998 (Cancun, Mexico ed., Vol. 1, pp. 359). Institute of Physics Publishing.