Observation and characterization of memristive silver filaments in amorphous zinc-tin-oxide

Hiep N. Tran, Thomas J. Raeber, Zijun C. Zhao, David R. McKenzie, Anthony S. Holland, Dougal G. McCulloch, Billy J. Murdoch, Jim G. Partridge

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

Abstract

Lateral memristors consisting of planar Ag electrodes (with sub-micrometer separation) supported on thin films of amorphous zinc-tin-oxide have been characterized. After an initial filament-forming process, each device exhibited volatile, resistive switching. In the low resistance state, the transport mechanism and conductance depended on prior activity and on the imposed current limit, mimicking biologic synaptic plasticity. Microscopic observations performed on each device revealed nanoscale filaments between the electrodes. These filaments were subject to Rayleigh instability and exhibited relaxation times determined by their effective radii. The relaxation times and on:off resistance ratios suggest suitability for threshold switching selector devices.

Original languageEnglish
Pages (from-to)1104-1110
Number of pages7
JournalMRS Communications
Volume8
Issue number3
DOIs
Publication statusPublished - 1 Sept 2018
Externally publishedYes

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