Nuclear Safeguards and Nuclear Forensic Analysis by Secondary Ion Mass Spectrometry

P. Peres, P.M.L. Hedberg, S. Walton, N. Montgomery, John Cliff, F. Rabemananjara, M. Schuhmacher

Research output: Contribution to journal › Article › peer-review

31 Citations (Scopus)

Original language	English
Pages (from-to)	561-565
Journal	Surface and Interface Analysis
Volume	45
DOIs	https://doi.org/10.1002/sia.5015
Publication status	Published - 2013

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title = "Nuclear Safeguards and Nuclear Forensic Analysis by Secondary Ion Mass Spectrometry",

author = "P. Peres and P.M.L. Hedberg and S. Walton and N. Montgomery and John Cliff and F. Rabemananjara and M. Schuhmacher",

year = "2013",

doi = "10.1002/sia.5015",

language = "English",

volume = "45",

pages = "561--565",

journal = "Surface and Interface Analysis",

issn = "0142-2421",

publisher = "John Wiley & Sons",

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TY - JOUR

T1 - Nuclear Safeguards and Nuclear Forensic Analysis by Secondary Ion Mass Spectrometry

AU - Peres, P.

AU - Hedberg, P.M.L.

AU - Walton, S.

AU - Montgomery, N.

AU - Cliff, John

AU - Rabemananjara, F.

AU - Schuhmacher, M.

PY - 2013

Y1 - 2013

U2 - 10.1002/sia.5015

DO - 10.1002/sia.5015

M3 - Article

SN - 0142-2421

VL - 45

SP - 561

EP - 565

JO - Surface and Interface Analysis

JF - Surface and Interface Analysis

ER -