Original language | English |
---|---|
Pages (from-to) | 561-565 |
Journal | Surface and Interface Analysis |
Volume | 45 |
DOIs | |
Publication status | Published - 2013 |
Nuclear Safeguards and Nuclear Forensic Analysis by Secondary Ion Mass Spectrometry
P. Peres, P.M.L. Hedberg, S. Walton, N. Montgomery, John Cliff, F. Rabemananjara, M. Schuhmacher
Research output: Contribution to journal › Article › peer-review
31
Citations
(Scopus)