Nondestructive Determination of P-N Junction Depth using Laser Beam Induced Current and Lateral Photovoltage Measurements

D.A. Redfern, Charles Musca, John Dell, Lorenzo Faraone

Research output: Chapter in Book/Conference paperConference paperpeer-review

13 Citations (Scopus)
Original languageEnglish
Title of host publicationCommad 2002 Proceedings (02EX 601)
EditorsM. Gal
Place of PublicationPiscataway, New Jersey, USA
PublisherIEEE, Institute of Electrical and Electronics Engineers
Pages193-196
Volume1 only
EditionSydney, NSW, Australia
ISBN (Print)0780375718
DOIs
Publication statusPublished - 2002
EventConference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2002 - Sydney, Australia
Duration: 11 Dec 200213 Dec 2002

Conference

ConferenceConference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2002
Country/TerritoryAustralia
CitySydney
Period11/12/0213/12/02

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