Nondestructive Determination of P-N Junction Depth using Laser Beam Induced Current and Lateral Photovoltage Measurements

D.A. Redfern; Charles Musca; John Dell; Lorenzo Faraone

doi:10.1109/COMMAD.2002.1237315

Nondestructive Determination of P-N Junction Depth using Laser Beam Induced Current and Lateral Photovoltage Measurements

D.A. Redfern, Charles Musca, John Dell, Lorenzo Faraone

Graduate Research School

Research output: Chapter in Book/Conference paper › Conference paper › peer-review

13 Citations (Scopus)

Original language	English
Title of host publication	Commad 2002 Proceedings (02EX 601)
Editors	M. Gal
Place of Publication	Piscataway, New Jersey, USA
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	193-196
Volume	1 only
Edition	Sydney, NSW, Australia
ISBN (Print)	0780375718
DOIs	https://doi.org/10.1109/COMMAD.2002.1237315
Publication status	Published - 2002
Event	Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2002 - Sydney, Australia Duration: 11 Dec 2002 → 13 Dec 2002

Conference

Conference	Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2002
Country/Territory	Australia
City	Sydney
Period	11/12/02 → 13/12/02

Access to Document

10.1109/COMMAD.2002.1237315

Cite this

Redfern, D. A., Musca, C., Dell, J., & Faraone, L. (2002). Nondestructive Determination of P-N Junction Depth using Laser Beam Induced Current and Lateral Photovoltage Measurements. In M. Gal (Ed.), Commad 2002 Proceedings (02EX 601) (Sydney, NSW, Australia ed., Vol. 1 only, pp. 193-196). IEEE, Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/COMMAD.2002.1237315

Redfern, D.A. ; Musca, Charles ; Dell, John et al. / Nondestructive Determination of P-N Junction Depth using Laser Beam Induced Current and Lateral Photovoltage Measurements. Commad 2002 Proceedings (02EX 601). editor / M. Gal. Vol. 1 only Sydney, NSW, Australia. ed. Piscataway, New Jersey, USA : IEEE, Institute of Electrical and Electronics Engineers, 2002. pp. 193-196

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title = "Nondestructive Determination of P-N Junction Depth using Laser Beam Induced Current and Lateral Photovoltage Measurements",

author = "D.A. Redfern and Charles Musca and John Dell and Lorenzo Faraone",

year = "2002",

doi = "10.1109/COMMAD.2002.1237315",

language = "English",

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volume = "1 only",

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booktitle = "Commad 2002 Proceedings (02EX 601)",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

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edition = "Sydney, NSW, Australia",

note = "Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2002 ; Conference date: 11-12-2002 Through 13-12-2002",

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Redfern, DA, Musca, C, Dell, J & Faraone, L 2002, Nondestructive Determination of P-N Junction Depth using Laser Beam Induced Current and Lateral Photovoltage Measurements. in M Gal (ed.), Commad 2002 Proceedings (02EX 601). Sydney, NSW, Australia edn, vol. 1 only, IEEE, Institute of Electrical and Electronics Engineers, Piscataway, New Jersey, USA, pp. 193-196, Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2002, Sydney, Australia, 11/12/02. https://doi.org/10.1109/COMMAD.2002.1237315

Nondestructive Determination of P-N Junction Depth using Laser Beam Induced Current and Lateral Photovoltage Measurements. / Redfern, D.A.; Musca, Charles; Dell, John et al.

Commad 2002 Proceedings (02EX 601). ed. / M. Gal. Vol. 1 only Sydney, NSW, Australia. ed. Piscataway, New Jersey, USA : IEEE, Institute of Electrical and Electronics Engineers, 2002. p. 193-196.

Research output: Chapter in Book/Conference paper › Conference paper › peer-review

TY - GEN

T1 - Nondestructive Determination of P-N Junction Depth using Laser Beam Induced Current and Lateral Photovoltage Measurements

AU - Redfern, D.A.

AU - Musca, Charles

AU - Dell, John

AU - Faraone, Lorenzo

PY - 2002

Y1 - 2002

U2 - 10.1109/COMMAD.2002.1237315

DO - 10.1109/COMMAD.2002.1237315

M3 - Conference paper

SN - 0780375718

VL - 1 only

SP - 193

EP - 196

BT - Commad 2002 Proceedings (02EX 601)

A2 - Gal, M.

PB - IEEE, Institute of Electrical and Electronics Engineers

CY - Piscataway, New Jersey, USA

T2 - Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2002

Y2 - 11 December 2002 through 13 December 2002

ER -

Redfern DA, Musca C, Dell J , Faraone L. Nondestructive Determination of P-N Junction Depth using Laser Beam Induced Current and Lateral Photovoltage Measurements. In Gal M, editor, Commad 2002 Proceedings (02EX 601). Sydney, NSW, Australia ed. Vol. 1 only. Piscataway, New Jersey, USA: IEEE, Institute of Electrical and Electronics Engineers. 2002. p. 193-196 https://doi.org/10.1109/COMMAD.2002.1237315