Nondestructive determination of defects in firmly joint plastic compounds with portable THz system

Thorsten Probst, Stefan F. Busch, Eduard Kraus, Benjamin Baudrit, Vincent P. Wallace, Martin Koch

    Research output: Chapter in Book/Conference paperConference paper

    Abstract

    We present a novel THz-TDS system used for the identification of defects in joint plastic. The system utilizes two delay lines, one long, for defect location and the other short, for imaging of the defect. Cross-sectional THz images that reveal defects (air gaps) are been confirmed using CT measurements.

    Original languageEnglish
    Title of host publication2013 38th International Conference on Infrared, Millimeter, and Terahertz Waves
    EditorsMarco Rahm
    Place of PublicationPiscataway, N.J
    PublisherIEEE, Institute of Electrical and Electronics Engineers
    ISBN (Print)9781467347174
    DOIs
    Publication statusPublished - 2013
    Event2013 38th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2013 - Mainz, Germany
    Duration: 1 Sep 20136 Sep 2013

    Conference

    Conference2013 38th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2013
    CountryGermany
    CityMainz
    Period1/09/136/09/13

    Fingerprint

    Plastics
    Defects
    Electric delay lines
    Imaging techniques
    Air

    Cite this

    Probst, T., Busch, S. F., Kraus, E., Baudrit, B., Wallace, V. P., & Koch, M. (2013). Nondestructive determination of defects in firmly joint plastic compounds with portable THz system. In M. Rahm (Ed.), 2013 38th International Conference on Infrared, Millimeter, and Terahertz Waves [6665805] Piscataway, N.J: IEEE, Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/IRMMW-THz.2013.6665805
    Probst, Thorsten ; Busch, Stefan F. ; Kraus, Eduard ; Baudrit, Benjamin ; Wallace, Vincent P. ; Koch, Martin. / Nondestructive determination of defects in firmly joint plastic compounds with portable THz system. 2013 38th International Conference on Infrared, Millimeter, and Terahertz Waves. editor / Marco Rahm. Piscataway, N.J : IEEE, Institute of Electrical and Electronics Engineers, 2013.
    @inproceedings{fea40bd876be4ed2a09e066bc0b9327e,
    title = "Nondestructive determination of defects in firmly joint plastic compounds with portable THz system",
    abstract = "We present a novel THz-TDS system used for the identification of defects in joint plastic. The system utilizes two delay lines, one long, for defect location and the other short, for imaging of the defect. Cross-sectional THz images that reveal defects (air gaps) are been confirmed using CT measurements.",
    author = "Thorsten Probst and Busch, {Stefan F.} and Eduard Kraus and Benjamin Baudrit and Wallace, {Vincent P.} and Martin Koch",
    year = "2013",
    doi = "10.1109/IRMMW-THz.2013.6665805",
    language = "English",
    isbn = "9781467347174",
    editor = "Marco Rahm",
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    publisher = "IEEE, Institute of Electrical and Electronics Engineers",
    address = "United States",

    }

    Probst, T, Busch, SF, Kraus, E, Baudrit, B, Wallace, VP & Koch, M 2013, Nondestructive determination of defects in firmly joint plastic compounds with portable THz system. in M Rahm (ed.), 2013 38th International Conference on Infrared, Millimeter, and Terahertz Waves., 6665805, IEEE, Institute of Electrical and Electronics Engineers, Piscataway, N.J, 2013 38th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2013, Mainz, Germany, 1/09/13. https://doi.org/10.1109/IRMMW-THz.2013.6665805

    Nondestructive determination of defects in firmly joint plastic compounds with portable THz system. / Probst, Thorsten; Busch, Stefan F.; Kraus, Eduard; Baudrit, Benjamin; Wallace, Vincent P.; Koch, Martin.

    2013 38th International Conference on Infrared, Millimeter, and Terahertz Waves. ed. / Marco Rahm. Piscataway, N.J : IEEE, Institute of Electrical and Electronics Engineers, 2013. 6665805.

    Research output: Chapter in Book/Conference paperConference paper

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    T1 - Nondestructive determination of defects in firmly joint plastic compounds with portable THz system

    AU - Probst, Thorsten

    AU - Busch, Stefan F.

    AU - Kraus, Eduard

    AU - Baudrit, Benjamin

    AU - Wallace, Vincent P.

    AU - Koch, Martin

    PY - 2013

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    N2 - We present a novel THz-TDS system used for the identification of defects in joint plastic. The system utilizes two delay lines, one long, for defect location and the other short, for imaging of the defect. Cross-sectional THz images that reveal defects (air gaps) are been confirmed using CT measurements.

    AB - We present a novel THz-TDS system used for the identification of defects in joint plastic. The system utilizes two delay lines, one long, for defect location and the other short, for imaging of the defect. Cross-sectional THz images that reveal defects (air gaps) are been confirmed using CT measurements.

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    M3 - Conference paper

    SN - 9781467347174

    BT - 2013 38th International Conference on Infrared, Millimeter, and Terahertz Waves

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    PB - IEEE, Institute of Electrical and Electronics Engineers

    CY - Piscataway, N.J

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    Probst T, Busch SF, Kraus E, Baudrit B, Wallace VP, Koch M. Nondestructive determination of defects in firmly joint plastic compounds with portable THz system. In Rahm M, editor, 2013 38th International Conference on Infrared, Millimeter, and Terahertz Waves. Piscataway, N.J: IEEE, Institute of Electrical and Electronics Engineers. 2013. 6665805 https://doi.org/10.1109/IRMMW-THz.2013.6665805