Nondestructive determination of defects in firmly joint plastic compounds with portable THz system

Thorsten Probst; Stefan F. Busch; Eduard Kraus; Benjamin Baudrit; Vincent P. Wallace; Martin Koch

doi:10.1109/IRMMW-THz.2013.6665805

Nondestructive determination of defects in firmly joint plastic compounds with portable THz system

Thorsten Probst, Stefan F. Busch, Eduard Kraus, Benjamin Baudrit, Vincent P. Wallace, Martin Koch

Research output: Chapter in Book/Conference paper › Conference paper › peer-review

1 Citation (Scopus)

Abstract

We present a novel THz-TDS system used for the identification of defects in joint plastic. The system utilizes two delay lines, one long, for defect location and the other short, for imaging of the defect. Cross-sectional THz images that reveal defects (air gaps) are been confirmed using CT measurements.

Original language	English
Title of host publication	2013 38th International Conference on Infrared, Millimeter, and Terahertz Waves
Editors	Marco Rahm
Place of Publication	Piscataway, N.J
Publisher	IEEE, Institute of Electrical and Electronics Engineers
ISBN (Print)	9781467347174
DOIs	https://doi.org/10.1109/IRMMW-THz.2013.6665805
Publication status	Published - 2013
Event	2013 38th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2013 - Mainz, Germany Duration: 1 Sep 2013 → 6 Sep 2013

Conference

Conference	2013 38th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2013
Country/Territory	Germany
City	Mainz
Period	1/09/13 → 6/09/13

Access to Document

10.1109/IRMMW-THz.2013.6665805

Cite this

Probst, T., Busch, S. F., Kraus, E., Baudrit, B., Wallace, V. P., & Koch, M. (2013). Nondestructive determination of defects in firmly joint plastic compounds with portable THz system. In M. Rahm (Ed.), 2013 38th International Conference on Infrared, Millimeter, and Terahertz Waves [6665805] IEEE, Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/IRMMW-THz.2013.6665805

@inproceedings{fea40bd876be4ed2a09e066bc0b9327e,

title = "Nondestructive determination of defects in firmly joint plastic compounds with portable THz system",

abstract = "We present a novel THz-TDS system used for the identification of defects in joint plastic. The system utilizes two delay lines, one long, for defect location and the other short, for imaging of the defect. Cross-sectional THz images that reveal defects (air gaps) are been confirmed using CT measurements.",

author = "Thorsten Probst and Busch, {Stefan F.} and Eduard Kraus and Benjamin Baudrit and Wallace, {Vincent P.} and Martin Koch",

year = "2013",

doi = "10.1109/IRMMW-THz.2013.6665805",

language = "English",

isbn = "9781467347174",

editor = "Marco Rahm",

booktitle = "2013 38th International Conference on Infrared, Millimeter, and Terahertz Waves",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

address = "United States",

note = "2013 38th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2013 ; Conference date: 01-09-2013 Through 06-09-2013",

}

Probst, T, Busch, SF, Kraus, E, Baudrit, B, Wallace, VP & Koch, M 2013, Nondestructive determination of defects in firmly joint plastic compounds with portable THz system. in M Rahm (ed.), 2013 38th International Conference on Infrared, Millimeter, and Terahertz Waves., 6665805, IEEE, Institute of Electrical and Electronics Engineers, Piscataway, N.J, 2013 38th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2013, Mainz, Germany, 1/09/13. https://doi.org/10.1109/IRMMW-THz.2013.6665805

Nondestructive determination of defects in firmly joint plastic compounds with portable THz system. / Probst, Thorsten; Busch, Stefan F.; Kraus, Eduard et al.

2013 38th International Conference on Infrared, Millimeter, and Terahertz Waves. ed. / Marco Rahm. Piscataway, N.J : IEEE, Institute of Electrical and Electronics Engineers, 2013. 6665805.

Research output: Chapter in Book/Conference paper › Conference paper › peer-review

TY - GEN

T1 - Nondestructive determination of defects in firmly joint plastic compounds with portable THz system

AU - Probst, Thorsten

AU - Busch, Stefan F.

AU - Kraus, Eduard

AU - Baudrit, Benjamin

AU - Wallace, Vincent P.

AU - Koch, Martin

PY - 2013

Y1 - 2013

N2 - We present a novel THz-TDS system used for the identification of defects in joint plastic. The system utilizes two delay lines, one long, for defect location and the other short, for imaging of the defect. Cross-sectional THz images that reveal defects (air gaps) are been confirmed using CT measurements.

AB - We present a novel THz-TDS system used for the identification of defects in joint plastic. The system utilizes two delay lines, one long, for defect location and the other short, for imaging of the defect. Cross-sectional THz images that reveal defects (air gaps) are been confirmed using CT measurements.

UR - http://www.scopus.com/inward/record.url?scp=84893401434&partnerID=8YFLogxK

U2 - 10.1109/IRMMW-THz.2013.6665805

DO - 10.1109/IRMMW-THz.2013.6665805

M3 - Conference paper

AN - SCOPUS:84893401434

SN - 9781467347174

BT - 2013 38th International Conference on Infrared, Millimeter, and Terahertz Waves

A2 - Rahm, Marco

PB - IEEE, Institute of Electrical and Electronics Engineers

CY - Piscataway, N.J

T2 - 2013 38th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2013

Y2 - 1 September 2013 through 6 September 2013

ER -

Probst T, Busch SF, Kraus E, Baudrit B, Wallace VP, Koch M. Nondestructive determination of defects in firmly joint plastic compounds with portable THz system. In Rahm M, editor, 2013 38th International Conference on Infrared, Millimeter, and Terahertz Waves. Piscataway, N.J: IEEE, Institute of Electrical and Electronics Engineers. 2013. 6665805 https://doi.org/10.1109/IRMMW-THz.2013.6665805

Nondestructive determination of defects in firmly joint plastic compounds with portable THz system

Abstract

Conference

Access to Document

Other files and links

Fingerprint

Cite this