Original language | English |
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Pages (from-to) | 113-137 |
Journal | Electra |
Volume | n/a |
Issue number | 175 |
Publication status | Published - 1997 |
New Trends and Techniques for Dynamic Security Assessment
B. Meyer, Tien Nguyen, M. Beissler, A.O. Ekwue, M. Eremia, N. Hatziargyriou, I.A. Hiskens, P. Kundur, W. Levy, R.J. Marceau, N. Martins, M. Muller-Reinke, M. Pavella, P. Scarpellini, M. Stubbe, H. Taoka, L. Vormedal, L. Wehenkel, G. Nativel
Research output: Contribution to journal › Article › peer-review