New needs for imaging and x-ray microanalysis standards: ESEM, CHIME and low voltage microanalysis

Brendan Griffin; C.E. Nockolds; M.R. Phillips; G. Remond

New needs for imaging and x-ray microanalysis standards: ESEM, CHIME and low voltage microanalysis

Brendan Griffin
, C.E. Nockolds
, M.R. Phillips
, G. Remond

Centre for Microscopy, Characterisation & Analysis

Research output: Chapter in Book/Conference paper › Conference paper

Original language	English
Title of host publication	Second Conference of the International Union of Microbeam Analysis Societies 2000
Editors	D.B. Williams, R. Shimizu
Place of Publication	UK
Publisher	Institute of Physics Publishing
Pages	395
Volume	none
Edition	Kailua-Kona, Hawaii
ISBN (Print)	0 07503 0685 8
Publication status	Published - 2000
Event	New needs for imaging and x-ray microanalysis standards: ESEM, CHIME and low voltage microanalysis - Kailua-Kona, Hawaii Duration: 1 Jan 2000 → …

Conference

Conference	New needs for imaging and x-ray microanalysis standards: ESEM, CHIME and low voltage microanalysis
Period	1/01/00 → …

Cite this

Griffin, B., Nockolds, C. E., Phillips, M. R., & Remond, G. (2000). New needs for imaging and x-ray microanalysis standards: ESEM, CHIME and low voltage microanalysis. In D. B. Williams, & R. Shimizu (Eds.), Second Conference of the International Union of Microbeam Analysis Societies 2000 (Kailua-Kona, Hawaii ed., Vol. none, pp. 395). Institute of Physics Publishing.

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booktitle = "Second Conference of the International Union of Microbeam Analysis Societies 2000",

publisher = "Institute of Physics Publishing",

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Griffin, B, Nockolds, CE, Phillips, MR & Remond, G 2000, New needs for imaging and x-ray microanalysis standards: ESEM, CHIME and low voltage microanalysis. in DB Williams & R Shimizu (eds), Second Conference of the International Union of Microbeam Analysis Societies 2000. Kailua-Kona, Hawaii edn, vol. none, Institute of Physics Publishing, UK, pp. 395, New needs for imaging and x-ray microanalysis standards: ESEM, CHIME and low voltage microanalysis, 1/01/00.

New needs for imaging and x-ray microanalysis standards: ESEM, CHIME and low voltage microanalysis. / Griffin, Brendan; Nockolds, C.E.; Phillips, M.R. et al.
Second Conference of the International Union of Microbeam Analysis Societies 2000. ed. / D.B. Williams; R. Shimizu. Vol. none Kailua-Kona, Hawaii. ed. UK: Institute of Physics Publishing, 2000. p. 395.

Research output: Chapter in Book/Conference paper › Conference paper

TY - GEN

T1 - New needs for imaging and x-ray microanalysis standards: ESEM, CHIME and low voltage microanalysis

AU - Griffin, Brendan

AU - Nockolds, C.E.

AU - Phillips, M.R.

AU - Remond, G.

PY - 2000

Y1 - 2000

M3 - Conference paper

SN - 0 07503 0685 8

VL - none

SP - 395

BT - Second Conference of the International Union of Microbeam Analysis Societies 2000

A2 - Williams, D.B.

A2 - Shimizu, R.

PB - Institute of Physics Publishing

CY - UK

T2 - New needs for imaging and x-ray microanalysis standards: ESEM, CHIME and low voltage microanalysis

Y2 - 1 January 2000

ER -