Nanoscale secondary ion mass spectrometry (NanoSIMS) as an analytical tool in the geosciences

Research output: Chapter in Book/Conference paperChapter

12 Citations (Scopus)
Original languageEnglish
Title of host publicationPrinciples and Practice of Analytical Techniques in Geosciences
EditorsK. Grice
PublisherThe Royal Society of Chemistry
Pages1-34
Volume4
ISBN (Print)9781849736497
DOIs
Publication statusPublished - 2015

Publication series

NameRSC Detection Science

Cite this

Kilburn, M., & Wacey, D. (2015). Nanoscale secondary ion mass spectrometry (NanoSIMS) as an analytical tool in the geosciences. In K. Grice (Ed.), Principles and Practice of Analytical Techniques in Geosciences (Vol. 4, pp. 1-34). (RSC Detection Science). The Royal Society of Chemistry. https://doi.org/10.1039/9781782625025-FP011