Nanoscale characterization of compound semiconductors using laser-pulsed atom probe tomography

Matthias C.T.D. Muller, David Saxey, A. Cerezo, G.D.W. Smith

Research output: Chapter in Book/Conference paper › Conference paper › peer-review

6 Citations (Scopus)

Original language	English
Title of host publication	Journal of Physics: Conference Series
Place of Publication	Cambridge, UK
Publisher	IOP Publishing
Pages	4 pp
Volume	209
ISBN (Print)	17426596
DOIs	https://doi.org/10.1088/1742-6596/209/1/012026
Publication status	Published - 2010
Event	16th International Conference on Microscopy of Semiconducting Materials - University of Oxford, United Kingdom Duration: 17 Mar 2009 → 20 Mar 2009

Conference	16th International Conference on Microscopy of Semiconducting Materials
Country/Territory	United Kingdom
Period	17/03/09 → 20/03/09

Access to Document

@inproceedings{1e73049b31c24f858a156916466fcede,

title = "Nanoscale characterization of compound semiconductors using laser-pulsed atom probe tomography",

author = "Muller, {Matthias C.T.D.} and David Saxey and A. Cerezo and G.D.W. Smith",

year = "2010",

doi = "10.1088/1742-6596/209/1/012026",

language = "English",

isbn = "17426596",

volume = "209",

pages = "4 pp",

booktitle = "Journal of Physics: Conference Series",

publisher = "IOP Publishing",

address = "United Kingdom",

note = "16th International Conference on Microscopy of Semiconducting Materials ; Conference date: 17-03-2009 Through 20-03-2009",

}

Muller, MCTD, Saxey, D, Cerezo, A & Smith, GDW 2010, Nanoscale characterization of compound semiconductors using laser-pulsed atom probe tomography. in Journal of Physics: Conference Series. vol. 209, IOP Publishing, Cambridge, UK, pp. 4 pp, 16th International Conference on Microscopy of Semiconducting Materials, United Kingdom, 17/03/09. https://doi.org/10.1088/1742-6596/209/1/012026

TY - GEN

T1 - Nanoscale characterization of compound semiconductors using laser-pulsed atom probe tomography

AU - Muller, Matthias C.T.D.

AU - Saxey, David

AU - Cerezo, A.

AU - Smith, G.D.W.

PY - 2010

Y1 - 2010

U2 - 10.1088/1742-6596/209/1/012026

DO - 10.1088/1742-6596/209/1/012026

M3 - Conference paper

SN - 17426596

VL - 209

SP - 4 pp

BT - Journal of Physics: Conference Series

PB - IOP Publishing

CY - Cambridge, UK

T2 - 16th International Conference on Microscopy of Semiconducting Materials

Y2 - 17 March 2009 through 20 March 2009

ER -