Nanoscale characterization of compound semiconductors using laser-pulsed atom probe tomography

Matthias C.T.D. Muller, David Saxey, A. Cerezo, G.D.W. Smith

Research output: Chapter in Book/Conference paperConference paper

6 Citations (Scopus)
Original languageEnglish
Title of host publicationJournal of Physics: Conference Series
Place of PublicationCambridge, UK
PublisherIOP Publishing
Pages4 pp
Volume209
ISBN (Print)17426596
DOIs
Publication statusPublished - 2010
EventNanoscale characterization of compound semiconductors using laser-pulsed atom probe tomography - University of Oxford, United Kingdom
Duration: 1 Jan 2010 → …

Conference

ConferenceNanoscale characterization of compound semiconductors using laser-pulsed atom probe tomography
Period1/01/10 → …

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