Multiple Scattering Detection in Optical Coherence Tomography using Speckle Statistics

    Research output: Chapter in Book/Conference paperConference paper

    1 Citation (Scopus)
    Original languageEnglish
    Title of host publication2010 IEEE PHOTONICS SOCIETY WINTER TOPICALS MEETING SERIES
    Place of PublicationNEW YORK, USA
    PublisherIEEE, Institute of Electrical and Electronics Engineers
    Pages61-62
    Volumen/a
    EditionMajorca, SPAIN
    ISBN (Print)9781424452408
    DOIs
    Publication statusPublished - 2010
    EventMultiple Scattering Detection in Optical Coherence Tomography using Speckle Statistics -
    Duration: 1 Jan 2010 → …

    Conference

    ConferenceMultiple Scattering Detection in Optical Coherence Tomography using Speckle Statistics
    Period1/01/10 → …

    Cite this

    Curatolo, A., Hillman, T., Kennedy, B., & Sampson, D. (2010). Multiple Scattering Detection in Optical Coherence Tomography using Speckle Statistics. In 2010 IEEE PHOTONICS SOCIETY WINTER TOPICALS MEETING SERIES (Majorca, SPAIN ed., Vol. n/a, pp. 61-62). NEW YORK, USA: IEEE, Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/PHOTWTM.2010.5421964
    Curatolo, Andrea ; Hillman, Timothy ; Kennedy, Brendan ; Sampson, David. / Multiple Scattering Detection in Optical Coherence Tomography using Speckle Statistics. 2010 IEEE PHOTONICS SOCIETY WINTER TOPICALS MEETING SERIES. Vol. n/a Majorca, SPAIN. ed. NEW YORK, USA : IEEE, Institute of Electrical and Electronics Engineers, 2010. pp. 61-62
    @inproceedings{3ea74b4397f6445c9d0364fe7fc756f0,
    title = "Multiple Scattering Detection in Optical Coherence Tomography using Speckle Statistics",
    author = "Andrea Curatolo and Timothy Hillman and Brendan Kennedy and David Sampson",
    year = "2010",
    doi = "10.1109/PHOTWTM.2010.5421964",
    language = "English",
    isbn = "9781424452408",
    volume = "n/a",
    pages = "61--62",
    booktitle = "2010 IEEE PHOTONICS SOCIETY WINTER TOPICALS MEETING SERIES",
    publisher = "IEEE, Institute of Electrical and Electronics Engineers",
    address = "United States",
    edition = "Majorca, SPAIN",

    }

    Curatolo, A, Hillman, T, Kennedy, B & Sampson, D 2010, Multiple Scattering Detection in Optical Coherence Tomography using Speckle Statistics. in 2010 IEEE PHOTONICS SOCIETY WINTER TOPICALS MEETING SERIES. Majorca, SPAIN edn, vol. n/a, IEEE, Institute of Electrical and Electronics Engineers, NEW YORK, USA, pp. 61-62, Multiple Scattering Detection in Optical Coherence Tomography using Speckle Statistics, 1/01/10. https://doi.org/10.1109/PHOTWTM.2010.5421964

    Multiple Scattering Detection in Optical Coherence Tomography using Speckle Statistics. / Curatolo, Andrea; Hillman, Timothy; Kennedy, Brendan; Sampson, David.

    2010 IEEE PHOTONICS SOCIETY WINTER TOPICALS MEETING SERIES. Vol. n/a Majorca, SPAIN. ed. NEW YORK, USA : IEEE, Institute of Electrical and Electronics Engineers, 2010. p. 61-62.

    Research output: Chapter in Book/Conference paperConference paper

    TY - GEN

    T1 - Multiple Scattering Detection in Optical Coherence Tomography using Speckle Statistics

    AU - Curatolo, Andrea

    AU - Hillman, Timothy

    AU - Kennedy, Brendan

    AU - Sampson, David

    PY - 2010

    Y1 - 2010

    U2 - 10.1109/PHOTWTM.2010.5421964

    DO - 10.1109/PHOTWTM.2010.5421964

    M3 - Conference paper

    SN - 9781424452408

    VL - n/a

    SP - 61

    EP - 62

    BT - 2010 IEEE PHOTONICS SOCIETY WINTER TOPICALS MEETING SERIES

    PB - IEEE, Institute of Electrical and Electronics Engineers

    CY - NEW YORK, USA

    ER -

    Curatolo A, Hillman T, Kennedy B, Sampson D. Multiple Scattering Detection in Optical Coherence Tomography using Speckle Statistics. In 2010 IEEE PHOTONICS SOCIETY WINTER TOPICALS MEETING SERIES. Majorca, SPAIN ed. Vol. n/a. NEW YORK, USA: IEEE, Institute of Electrical and Electronics Engineers. 2010. p. 61-62 https://doi.org/10.1109/PHOTWTM.2010.5421964