Monolithic integration of an infrared photon detector with a MEMS-based tunable filter

Charlie C. Musca, J. Antoszewski, K. J. Winchester, A. J. Keating, T. Nguyen, K. K.M.B.D. Silva, J. M. Dell, L. Faraone, P. Mitra, J. D. Beck, M. R. Skokan, J. E. Robinson

Research output: Contribution to journalArticlepeer-review

65 Citations (Scopus)

Abstract

The monolithic integration of a low-temperature microelectromechanical system (MEMS) and HgCdTe infrared detector technology has been implemented and characterized. The MEMS-based tunable optical filter, integrated with an infrared detector, selects narrow wavelength bands in the range from 1.6 to 2.5 μm within the short-wavelength infrared (SWIR) region of the electromagnetic spectrum. The entire fabrication process is compatible with two-dimensional infrared focal plane array technology. The fabricated device consists of an HgCdTe SWIR photoconductor, two distributed Bragg mirrors formed of Ge-SiO-Ge, a sacrificial spacer layer within the cavity, which is then removed to leave an air gap, and a silicon nitride membrane for structural support. The tuning spectrum from fabricated MEMS filters on photoconductive detectors shows a wide tuning range, and high percentage transmission is achieved with a tuning voltage of only 7.5 V. The full-width at half-maximum ranged from 95 to 105 nm over a tuning range of 2.2-1.85 μm.

Original languageEnglish
Pages (from-to)888-890
Number of pages3
JournalIEEE Electron Device Letters
Volume26
Issue number12
DOIs
Publication statusPublished - Dec 2005

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