Modelling and Measurement of Remanence Enhancement in Two Phase Nanocrystalline Materials

E.H. Feutrill, J. Ding, R. Street, Paul Mccormick

Research output: Chapter in Book/Conference paper › Conference paper

Original language	English
Title of host publication	IUMRS International Conference on Advanced Materials
Place of Publication	Tokyo
Pages	1055-1059
Publication status	Published - 1994
Event	Modelling and Measurement of Remanence Enhancement in Two Phase Nanocrystalline Materials - Duration: 1 Jan 1994 → …

Conference	Modelling and Measurement of Remanence Enhancement in Two Phase Nanocrystalline Materials
Period	1/01/94 → …

Cite this

@inproceedings{aacbd2b4e2c840d19596cb8d9f7b7db5,

title = "Modelling and Measurement of Remanence Enhancement in Two Phase Nanocrystalline Materials",

author = "E.H. Feutrill and J. Ding and R. Street and Paul Mccormick",

year = "1994",

language = "English",

pages = "1055--1059",

booktitle = "IUMRS International Conference on Advanced Materials",

note = "Modelling and Measurement of Remanence Enhancement in Two Phase Nanocrystalline Materials ; Conference date: 01-01-1994",

}

TY - GEN

T1 - Modelling and Measurement of Remanence Enhancement in Two Phase Nanocrystalline Materials

AU - Feutrill, E.H.

AU - Ding, J.

AU - Street, R.

AU - Mccormick, Paul

PY - 1994

Y1 - 1994

M3 - Conference paper

SP - 1055

EP - 1059

BT - IUMRS International Conference on Advanced Materials

CY - Tokyo

T2 - Modelling and Measurement of Remanence Enhancement in Two Phase Nanocrystalline Materials

Y2 - 1 January 1994

ER -