Mobility Characterization by Magnetoresistance in Ultra Thin SOI Ring-FETs

T.V. Chandrasekhar Rao, S. Cristoloveanu, Jarek Antoszewski, T. Nguyen, H. Hovel, P. Gentil, Lorenzo Faraone

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@article{e235f931e66c475394a102e059a491cd,

title = "Mobility Characterization by Magnetoresistance in Ultra Thin SOI Ring-FETs",

author = "{Chandrasekhar Rao}, T.V. and S. Cristoloveanu and Jarek Antoszewski and T. Nguyen and H. Hovel and P. Gentil and Lorenzo Faraone",

year = "2007",

doi = "10.1149/1.2728872",

language = "English",

volume = "6",

pages = "279--284",

journal = "ECS Transactions",

number = "4",

}

TY - JOUR

T1 - Mobility Characterization by Magnetoresistance in Ultra Thin SOI Ring-FETs

AU - Chandrasekhar Rao, T.V.

AU - Cristoloveanu, S.

AU - Antoszewski, Jarek

AU - Nguyen, T.

AU - Hovel, H.

AU - Gentil, P.

AU - Faraone, Lorenzo

PY - 2007

Y1 - 2007

U2 - 10.1149/1.2728872

DO - 10.1149/1.2728872

M3 - Article

VL - 6

SP - 279

EP - 284

JO - ECS Transactions

JF - ECS Transactions

IS - 4

ER -