Minority Carrier Lifetime Measurement in GaN by a Differential Phase Technique

W. Tan; S.M.R. Spaargaren; Giacinta Parish; Brett Nener; U.K. Mishra

doi:10.1109/COMMAD.2002.1237206

Minority Carrier Lifetime Measurement in GaN by a Differential Phase Technique

W. Tan, S.M.R. Spaargaren, Giacinta Parish, Brett Nener, U.K. Mishra

Graduate Research School

Research output: Chapter in Book/Conference paper › Conference paper › peer-review

3 Citations (Scopus)

Original language	English
Title of host publication	COMMAD 2002 PROCEEDINGS (02EX 601)
Editors	M. Gal
Place of Publication	Piscataway, New Jersey, USA
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	117-120
Volume	1 only
Edition	Sydney, NSW, Australia
ISBN (Print)	0780375718
DOIs	https://doi.org/10.1109/COMMAD.2002.1237206
Publication status	Published - 2002
Event	Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2002 - Sydney, Australia Duration: 11 Dec 2002 → 13 Dec 2002

Conference

Conference	Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2002
Country/Territory	Australia
City	Sydney
Period	11/12/02 → 13/12/02

Access to Document

10.1109/COMMAD.2002.1237206

Cite this

@inproceedings{420ad1b31bbb4c55b945ff20688a6cc7,

title = "Minority Carrier Lifetime Measurement in GaN by a Differential Phase Technique",

author = "W. Tan and S.M.R. Spaargaren and Giacinta Parish and Brett Nener and U.K. Mishra",

year = "2002",

doi = "10.1109/COMMAD.2002.1237206",

language = "English",

isbn = "0780375718",

volume = "1 only",

pages = "117--120",

editor = "M. Gal",

booktitle = "COMMAD 2002 PROCEEDINGS (02EX 601)",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

address = "United States",

edition = "Sydney, NSW, Australia",

note = "Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2002 ; Conference date: 11-12-2002 Through 13-12-2002",

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Tan, W, Spaargaren, SMR, Parish, G , Nener, B & Mishra, UK 2002, Minority Carrier Lifetime Measurement in GaN by a Differential Phase Technique. in M Gal (ed.), COMMAD 2002 PROCEEDINGS (02EX 601). Sydney, NSW, Australia edn, vol. 1 only, IEEE, Institute of Electrical and Electronics Engineers, Piscataway, New Jersey, USA, pp. 117-120, Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2002, Sydney, Australia, 11/12/02. https://doi.org/10.1109/COMMAD.2002.1237206

Minority Carrier Lifetime Measurement in GaN by a Differential Phase Technique. / Tan, W.; Spaargaren, S.M.R.; Parish, Giacinta et al.
COMMAD 2002 PROCEEDINGS (02EX 601). ed. / M. Gal. Vol. 1 only Sydney, NSW, Australia. ed. Piscataway, New Jersey, USA: IEEE, Institute of Electrical and Electronics Engineers, 2002. p. 117-120.

Research output: Chapter in Book/Conference paper › Conference paper › peer-review

TY - GEN

T1 - Minority Carrier Lifetime Measurement in GaN by a Differential Phase Technique

AU - Tan, W.

AU - Spaargaren, S.M.R.

AU - Parish, Giacinta

AU - Nener, Brett

AU - Mishra, U.K.

PY - 2002

Y1 - 2002

U2 - 10.1109/COMMAD.2002.1237206

DO - 10.1109/COMMAD.2002.1237206

M3 - Conference paper

SN - 0780375718

VL - 1 only

SP - 117

EP - 120

BT - COMMAD 2002 PROCEEDINGS (02EX 601)

A2 - Gal, M.

PB - IEEE, Institute of Electrical and Electronics Engineers

CY - Piscataway, New Jersey, USA

T2 - Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2002

Y2 - 11 December 2002 through 13 December 2002

ER -