Minority Carrier Lifetime Measurement in GaN by a Differential Phase Technique

W. Tan, S.M.R. Spaargaren, Giacinta Parish, Brett Nener, U.K. Mishra

Research output: Chapter in Book/Conference paperConference paper

3 Citations (Scopus)
Original languageEnglish
Title of host publicationCOMMAD 2002 PROCEEDINGS (02EX 601)
EditorsM. Gal
Place of PublicationPiscataway, New Jersey, USA
PublisherIEEE, Institute of Electrical and Electronics Engineers
Pages117-120
Volume1 only
EditionSydney, NSW, Australia
ISBN (Print)0780375718
Publication statusPublished - 2002
EventMinority Carrier Lifetime Measurement in GaN by a Differential Phase Technique - Sydney, NSW, Australia
Duration: 1 Jan 2002 → …

Conference

ConferenceMinority Carrier Lifetime Measurement in GaN by a Differential Phase Technique
Period1/01/02 → …

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