Here we present a general alignment algorithm for an edge illumination x-ray phase contrast imaging system, which is used with the laboratory systems developed at UCL. It has the flexibility to be used with all current mask designs, and could also be applied to future synchrotron based systems. The algorithm has proved to be robust experimentally, and can be used for the automatization of future commercial systems through automatic alignment and alignment correction. © 2013 AIP Publishing LLC.
|Pages (from-to)||083702-1 - 083702-7|
|Journal||Review of Scientific Instruments|
|Publication status||Published - 2013|