Mechanical Stress Caused Frequency Drift in Cryogenic Sapphire Resonators

S. Chang, Anthony Mann

Research output: Chapter in Book/Conference paperConference paper

13 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings of the 2001 Institute of Electrical and Electronics Engineers International Frequency Control Symposium & PD
EditorsJ. Vig
Place of PublicationUSA
PublisherIEEE, Institute of Electrical and Electronics Engineers
Pages710-714
Volume1
EditionSeattle, USA
ISBN (Print)10756787
Publication statusPublished - 2001
EventMechanical Stress Caused Frequency Drift in Cryogenic Sapphire Resonators - Seattle, USA
Duration: 1 Jan 2001 → …

Conference

ConferenceMechanical Stress Caused Frequency Drift in Cryogenic Sapphire Resonators
Period1/01/01 → …

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