Mechanical Stress Caused Frequency Drift in Cryogenic Sapphire Resonators

S. Chang, Anthony Mann

Research output: Chapter in Book/Conference paperConference paper

13 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings of the 2001 Institute of Electrical and Electronics Engineers International Frequency Control Symposium & PD
EditorsJ. Vig
Place of PublicationUSA
PublisherIEEE, Institute of Electrical and Electronics Engineers
Pages710-714
Volume1
EditionSeattle, USA
ISBN (Print)10756787
Publication statusPublished - 2001
EventMechanical Stress Caused Frequency Drift in Cryogenic Sapphire Resonators - Seattle, USA
Duration: 1 Jan 2001 → …

Conference

ConferenceMechanical Stress Caused Frequency Drift in Cryogenic Sapphire Resonators
Period1/01/01 → …

Cite this

Chang, S., & Mann, A. (2001). Mechanical Stress Caused Frequency Drift in Cryogenic Sapphire Resonators. In J. Vig (Ed.), Proceedings of the 2001 Institute of Electrical and Electronics Engineers International Frequency Control Symposium & PD (Seattle, USA ed., Vol. 1, pp. 710-714). USA: IEEE, Institute of Electrical and Electronics Engineers.
Chang, S. ; Mann, Anthony. / Mechanical Stress Caused Frequency Drift in Cryogenic Sapphire Resonators. Proceedings of the 2001 Institute of Electrical and Electronics Engineers International Frequency Control Symposium & PD. editor / J. Vig. Vol. 1 Seattle, USA. ed. USA : IEEE, Institute of Electrical and Electronics Engineers, 2001. pp. 710-714
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editor = "J. Vig",
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Chang, S & Mann, A 2001, Mechanical Stress Caused Frequency Drift in Cryogenic Sapphire Resonators. in J Vig (ed.), Proceedings of the 2001 Institute of Electrical and Electronics Engineers International Frequency Control Symposium & PD. Seattle, USA edn, vol. 1, IEEE, Institute of Electrical and Electronics Engineers, USA, pp. 710-714, Mechanical Stress Caused Frequency Drift in Cryogenic Sapphire Resonators, 1/01/01.

Mechanical Stress Caused Frequency Drift in Cryogenic Sapphire Resonators. / Chang, S.; Mann, Anthony.

Proceedings of the 2001 Institute of Electrical and Electronics Engineers International Frequency Control Symposium & PD. ed. / J. Vig. Vol. 1 Seattle, USA. ed. USA : IEEE, Institute of Electrical and Electronics Engineers, 2001. p. 710-714.

Research output: Chapter in Book/Conference paperConference paper

TY - GEN

T1 - Mechanical Stress Caused Frequency Drift in Cryogenic Sapphire Resonators

AU - Chang, S.

AU - Mann, Anthony

PY - 2001

Y1 - 2001

M3 - Conference paper

SN - 10756787

VL - 1

SP - 710

EP - 714

BT - Proceedings of the 2001 Institute of Electrical and Electronics Engineers International Frequency Control Symposium & PD

A2 - Vig, J.

PB - IEEE, Institute of Electrical and Electronics Engineers

CY - USA

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Chang S, Mann A. Mechanical Stress Caused Frequency Drift in Cryogenic Sapphire Resonators. In Vig J, editor, Proceedings of the 2001 Institute of Electrical and Electronics Engineers International Frequency Control Symposium & PD. Seattle, USA ed. Vol. 1. USA: IEEE, Institute of Electrical and Electronics Engineers. 2001. p. 710-714