Mechanical Stress Caused Frequency Drift in Cryogenic Sapphire Resonators

S. Chang; Anthony Mann

Mechanical Stress Caused Frequency Drift in Cryogenic Sapphire Resonators

S. Chang, Anthony Mann

Graduate Research School

Research output: Chapter in Book/Conference paper › Conference paper › peer-review

Original language	English
Title of host publication	Proceedings of the 2001 Institute of Electrical and Electronics Engineers International Frequency Control Symposium & PD
Editors	J. Vig
Place of Publication	USA
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	710-714
Volume	1
Edition	Seattle, USA
ISBN (Print)	10756787
Publication status	Published - 2001
Event	Mechanical Stress Caused Frequency Drift in Cryogenic Sapphire Resonators - Seattle, USA Duration: 1 Jan 2001 → …

Conference

Conference	Mechanical Stress Caused Frequency Drift in Cryogenic Sapphire Resonators
Period	1/01/01 → …

Cite this

@inproceedings{434f1b0ff69f4c01bec676090b139a24,

title = "Mechanical Stress Caused Frequency Drift in Cryogenic Sapphire Resonators",

author = "S. Chang and Anthony Mann",

year = "2001",

language = "English",

isbn = "10756787",

volume = "1",

pages = "710--714",

editor = "J. Vig",

booktitle = "Proceedings of the 2001 Institute of Electrical and Electronics Engineers International Frequency Control Symposium & PD",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

address = "United States",

edition = "Seattle, USA",

note = "Mechanical Stress Caused Frequency Drift in Cryogenic Sapphire Resonators ; Conference date: 01-01-2001",

}

Chang, S & Mann, A 2001, Mechanical Stress Caused Frequency Drift in Cryogenic Sapphire Resonators. in J Vig (ed.), Proceedings of the 2001 Institute of Electrical and Electronics Engineers International Frequency Control Symposium & PD. Seattle, USA edn, vol. 1, IEEE, Institute of Electrical and Electronics Engineers, USA, pp. 710-714, Mechanical Stress Caused Frequency Drift in Cryogenic Sapphire Resonators, 1/01/01.

Mechanical Stress Caused Frequency Drift in Cryogenic Sapphire Resonators. / Chang, S.; Mann, Anthony.
Proceedings of the 2001 Institute of Electrical and Electronics Engineers International Frequency Control Symposium & PD. ed. / J. Vig. Vol. 1 Seattle, USA. ed. USA: IEEE, Institute of Electrical and Electronics Engineers, 2001. p. 710-714.

Research output: Chapter in Book/Conference paper › Conference paper › peer-review

TY - GEN

T1 - Mechanical Stress Caused Frequency Drift in Cryogenic Sapphire Resonators

AU - Chang, S.

AU - Mann, Anthony

PY - 2001

Y1 - 2001

M3 - Conference paper

SN - 10756787

VL - 1

SP - 710

EP - 714

BT - Proceedings of the 2001 Institute of Electrical and Electronics Engineers International Frequency Control Symposium & PD

A2 - Vig, J.

PB - IEEE, Institute of Electrical and Electronics Engineers

CY - USA

T2 - Mechanical Stress Caused Frequency Drift in Cryogenic Sapphire Resonators

Y2 - 1 January 2001

ER -