Measurements of low-loss crystalline materials for high-Q temperature stable resonator applications

Michael Tobar; J. Krupka; John Hartnett; R.G. Geyer; Eugene Ivanov

Measurements of low-loss crystalline materials for high-Q temperature stable resonator applications

Michael Tobar, J. Krupka, John Hartnett, R.G. Geyer, Eugene Ivanov

Graduate Research School

Research output: Chapter in Book/Conference paper › Conference paper

Original language	English
Title of host publication	Proceedings of the 1999 Joint Meeting of the European Frequency and Time Forum and the Institute of Electrical and Elect
Place of Publication	USA
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	573-576
Volume	2
Edition	Besancon, France
ISBN (Print)	0780354001
Publication status	Published - 1999
Event	Measurements of low-loss crystalline materials for high-Q temperature stable resonator applications - Besancon, France Duration: 1 Jan 1999 → …

Conference

Conference	Measurements of low-loss crystalline materials for high-Q temperature stable resonator applications
Period	1/01/99 → …

Cite this

Tobar, M., Krupka, J., Hartnett, J., Geyer, R. G., & Ivanov, E. (1999). Measurements of low-loss crystalline materials for high-Q temperature stable resonator applications. In Proceedings of the 1999 Joint Meeting of the European Frequency and Time Forum and the Institute of Electrical and Elect (Besancon, France ed., Vol. 2, pp. 573-576). IEEE, Institute of Electrical and Electronics Engineers.

Tobar, Michael ; Krupka, J. ; Hartnett, John et al. / Measurements of low-loss crystalline materials for high-Q temperature stable resonator applications. Proceedings of the 1999 Joint Meeting of the European Frequency and Time Forum and the Institute of Electrical and Elect. Vol. 2 Besancon, France. ed. USA : IEEE, Institute of Electrical and Electronics Engineers, 1999. pp. 573-576

@inproceedings{40d9a6ff60df4fb28ad778fa531ba001,

title = "Measurements of low-loss crystalline materials for high-Q temperature stable resonator applications",

author = "Michael Tobar and J. Krupka and John Hartnett and R.G. Geyer and Eugene Ivanov",

year = "1999",

language = "English",

isbn = "0780354001",

volume = "2",

pages = "573--576",

booktitle = "Proceedings of the 1999 Joint Meeting of the European Frequency and Time Forum and the Institute of Electrical and Elect",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

address = "United States",

edition = "Besancon, France",

note = "Measurements of low-loss crystalline materials for high-Q temperature stable resonator applications ; Conference date: 01-01-1999",

}

Tobar, M, Krupka, J, Hartnett, J, Geyer, RG & Ivanov, E 1999, Measurements of low-loss crystalline materials for high-Q temperature stable resonator applications. in Proceedings of the 1999 Joint Meeting of the European Frequency and Time Forum and the Institute of Electrical and Elect. Besancon, France edn, vol. 2, IEEE, Institute of Electrical and Electronics Engineers, USA, pp. 573-576, Measurements of low-loss crystalline materials for high-Q temperature stable resonator applications, 1/01/99.

Measurements of low-loss crystalline materials for high-Q temperature stable resonator applications. / Tobar, Michael; Krupka, J.; Hartnett, John et al.
Proceedings of the 1999 Joint Meeting of the European Frequency and Time Forum and the Institute of Electrical and Elect. Vol. 2 Besancon, France. ed. USA: IEEE, Institute of Electrical and Electronics Engineers, 1999. p. 573-576.

Research output: Chapter in Book/Conference paper › Conference paper

TY - GEN

T1 - Measurements of low-loss crystalline materials for high-Q temperature stable resonator applications

AU - Tobar, Michael

AU - Krupka, J.

AU - Hartnett, John

AU - Geyer, R.G.

AU - Ivanov, Eugene

PY - 1999

Y1 - 1999

M3 - Conference paper

SN - 0780354001

VL - 2

SP - 573

EP - 576

BT - Proceedings of the 1999 Joint Meeting of the European Frequency and Time Forum and the Institute of Electrical and Elect

PB - IEEE, Institute of Electrical and Electronics Engineers

CY - USA

T2 - Measurements of low-loss crystalline materials for high-Q temperature stable resonator applications

Y2 - 1 January 1999

ER -

Tobar M, Krupka J, Hartnett J, Geyer RG, Ivanov E. Measurements of low-loss crystalline materials for high-Q temperature stable resonator applications. In Proceedings of the 1999 Joint Meeting of the European Frequency and Time Forum and the Institute of Electrical and Elect. Besancon, France ed. Vol. 2. USA: IEEE, Institute of Electrical and Electronics Engineers. 1999. p. 573-576