TY - JOUR
T1 - Measurements of insulator band parameters using combination of single-electron and two-electron spectroscopy
AU - Samarin, Sergey
AU - Artamonov, O.M.
AU - Suvorova, Alexandra
AU - Sergeant, A.D.
AU - Williams, James
PY - 2004
Y1 - 2004
N2 - We describe the application of low energy time-of-flight coincidence (e,2e) spectroscopy for measurements of the energy band parameters of a dielectric. The (e,2e) spectrometer can operate also in a single-electron mode by switching off coincidence conditions, and can be used for recording electron energy loss spectra (EELS). Thus, the combination of (e,2e) and EELS allows the measurement of energy gap E valence bandwidth DeltaE(val), electron affinity chi and excitonic levels position E-ex of a dielectric. The energy band parameters of LiF film deposited on Si(001) surface are measured: E-g = (13.0 +/- 0.4) eV, DeltaE(val) = (6.0 +/- 0.5) eV, E-ex = (10.0 +/- 0.4) eV, chi = (1.0 +/- 0.4) eV. (C) 2003 Elsevier Ltd. All rights reserved.
AB - We describe the application of low energy time-of-flight coincidence (e,2e) spectroscopy for measurements of the energy band parameters of a dielectric. The (e,2e) spectrometer can operate also in a single-electron mode by switching off coincidence conditions, and can be used for recording electron energy loss spectra (EELS). Thus, the combination of (e,2e) and EELS allows the measurement of energy gap E valence bandwidth DeltaE(val), electron affinity chi and excitonic levels position E-ex of a dielectric. The energy band parameters of LiF film deposited on Si(001) surface are measured: E-g = (13.0 +/- 0.4) eV, DeltaE(val) = (6.0 +/- 0.5) eV, E-ex = (10.0 +/- 0.4) eV, chi = (1.0 +/- 0.4) eV. (C) 2003 Elsevier Ltd. All rights reserved.
U2 - 10.1016/j.ssc.2003.11.008
DO - 10.1016/j.ssc.2003.11.008
M3 - Article
VL - 129
SP - 389
EP - 393
JO - Solid State Communications
JF - Solid State Communications
SN - 0038-1098
IS - 6
ER -