Measurement of the Equivalent Circuit Parameters of Chemical Interface Layers on Bulk Acoustic Wave Resonators

R.C. C. Holt, G.J. J. Gouws, John Z. Zhen

Research output: Chapter in Book/Conference paperConference paperpeer-review

Original languageEnglish
Title of host publicationProceedings of the 2004 IEEE International Ultrasonics, Ferroelectrics, and Frequency Control Joint 50th Anniversary Conference
Place of PublicationMontréal, Canada
PublisherIEEE, Institute of Electrical and Electronics Engineers
Pages311-316
Number of pages6
Volume1
Publication statusPublished - 2004
Event2004 IEEE International Ultrasonics, Ferroelectrics, and Frequency Control Joint 50th Anniversary Conference - Montréal, Canada
Duration: 24 Aug 200427 Aug 2004

Conference

Conference2004 IEEE International Ultrasonics, Ferroelectrics, and Frequency Control Joint 50th Anniversary Conference
Period24/08/0427/08/04

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