Measurement driven models of nonlinear electronic components

N. Tufillaro, D. Usikov, L. Barford, D. M. Walker, D. Schreurs

Research output: Chapter in Book/Conference paper › Conference paper

Original language	English
Title of host publication	55th ARFTG Conference Digest
Editors	G. Burns
Place of Publication	Boston, Massachusetts
Publisher	Institute of Electronic and Electrical Engineers
Pages	27-34
Volume	1
Edition	Boston, Massachusetts
Publication status	Published - 2000
Event	Measurement driven models of nonlinear electronic components - Boston, Massachusetts Duration: 1 Jan 2000 → …

Conference	Measurement driven models of nonlinear electronic components
Period	1/01/00 → …

Cite this

@inproceedings{5f221fb309d942b1969048208a61d9ef,

title = "Measurement driven models of nonlinear electronic components",

author = "N. Tufillaro and D. Usikov and L. Barford and Walker, {D. M.} and D. Schreurs",

year = "2000",

language = "English",

volume = "1",

pages = "27--34",

editor = "G. Burns",

booktitle = "55th ARFTG Conference Digest",

publisher = "Institute of Electronic and Electrical Engineers",

edition = "Boston, Massachusetts",

note = "Measurement driven models of nonlinear electronic components ; Conference date: 01-01-2000",

}

TY - GEN

T1 - Measurement driven models of nonlinear electronic components

AU - Tufillaro, N.

AU - Usikov, D.

AU - Barford, L.

AU - Walker, D. M.

AU - Schreurs, D.

PY - 2000

Y1 - 2000

M3 - Conference paper

VL - 1

SP - 27

EP - 34

BT - 55th ARFTG Conference Digest

A2 - Burns, G.

PB - Institute of Electronic and Electrical Engineers

CY - Boston, Massachusetts

T2 - Measurement driven models of nonlinear electronic components

Y2 - 1 January 2000

ER -