(Mass) Sensitive High Resolution Microbeam Analysis Using a Scanning Ion Probe: The Next Step

Brendan Griffin, N. Mcnaughton, F. Hillion

Research output: Chapter in Book/Conference paperConference paper

Original languageEnglish
Title of host publication17th Australian Conference on Electron Microscopy
EditorsJ. Terlet, P. Self, M. Henderson, M. Dayman
Place of PublicationAdelaide, South Australia
PublisherAustralian Society for Electron Microscopy Inc.
Pages35
Volumeone
EditionAdelaide, South Australia
ISBN (Print)095804080X
Publication statusPublished - 2002
Event(Mass) Sensitive High Resolution Microbeam Analysis Using a Scanning Ion Probe: The Next Step - Adelaide, South Australia
Duration: 1 Jan 2002 → …

Conference

Conference(Mass) Sensitive High Resolution Microbeam Analysis Using a Scanning Ion Probe: The Next Step
Period1/01/02 → …

Cite this

Griffin, B., Mcnaughton, N., & Hillion, F. (2002). (Mass) Sensitive High Resolution Microbeam Analysis Using a Scanning Ion Probe: The Next Step. In J. Terlet, P. Self, M. Henderson, & M. Dayman (Eds.), 17th Australian Conference on Electron Microscopy (Adelaide, South Australia ed., Vol. one, pp. 35). Australian Society for Electron Microscopy Inc..