(Mass) Sensitive High Resolution Microbeam Analysis Using a Scanning Ion Probe: The Next Step

Brendan Griffin, N. Mcnaughton, F. Hillion

Research output: Chapter in Book/Conference paperConference paper

Original languageEnglish
Title of host publication17th Australian Conference on Electron Microscopy
EditorsJ. Terlet, P. Self, M. Henderson, M. Dayman
Place of PublicationAdelaide, South Australia
PublisherAustralian Society for Electron Microscopy Inc.
Pages35
Volumeone
EditionAdelaide, South Australia
ISBN (Print)095804080X
Publication statusPublished - 2002
Event(Mass) Sensitive High Resolution Microbeam Analysis Using a Scanning Ion Probe: The Next Step - Adelaide, South Australia
Duration: 1 Jan 2002 → …

Conference

Conference(Mass) Sensitive High Resolution Microbeam Analysis Using a Scanning Ion Probe: The Next Step
Period1/01/02 → …

Cite this

Griffin, B., Mcnaughton, N., & Hillion, F. (2002). (Mass) Sensitive High Resolution Microbeam Analysis Using a Scanning Ion Probe: The Next Step. In J. Terlet, P. Self, M. Henderson, & M. Dayman (Eds.), 17th Australian Conference on Electron Microscopy (Adelaide, South Australia ed., Vol. one, pp. 35). Adelaide, South Australia: Australian Society for Electron Microscopy Inc..
Griffin, Brendan ; Mcnaughton, N. ; Hillion, F. / (Mass) Sensitive High Resolution Microbeam Analysis Using a Scanning Ion Probe: The Next Step. 17th Australian Conference on Electron Microscopy. editor / J. Terlet ; P. Self ; M. Henderson ; M. Dayman. Vol. one Adelaide, South Australia. ed. Adelaide, South Australia : Australian Society for Electron Microscopy Inc., 2002. pp. 35
@inproceedings{d5742ee1565b4860b27771b0416d26d9,
title = "(Mass) Sensitive High Resolution Microbeam Analysis Using a Scanning Ion Probe: The Next Step",
author = "Brendan Griffin and N. Mcnaughton and F. Hillion",
year = "2002",
language = "English",
isbn = "095804080X",
volume = "one",
pages = "35",
editor = "J. Terlet and P. Self and M. Henderson and M. Dayman",
booktitle = "17th Australian Conference on Electron Microscopy",
publisher = "Australian Society for Electron Microscopy Inc.",
edition = "Adelaide, South Australia",

}

Griffin, B, Mcnaughton, N & Hillion, F 2002, (Mass) Sensitive High Resolution Microbeam Analysis Using a Scanning Ion Probe: The Next Step. in J Terlet, P Self, M Henderson & M Dayman (eds), 17th Australian Conference on Electron Microscopy. Adelaide, South Australia edn, vol. one, Australian Society for Electron Microscopy Inc., Adelaide, South Australia, pp. 35, (Mass) Sensitive High Resolution Microbeam Analysis Using a Scanning Ion Probe: The Next Step, 1/01/02.

(Mass) Sensitive High Resolution Microbeam Analysis Using a Scanning Ion Probe: The Next Step. / Griffin, Brendan; Mcnaughton, N.; Hillion, F.

17th Australian Conference on Electron Microscopy. ed. / J. Terlet; P. Self; M. Henderson; M. Dayman. Vol. one Adelaide, South Australia. ed. Adelaide, South Australia : Australian Society for Electron Microscopy Inc., 2002. p. 35.

Research output: Chapter in Book/Conference paperConference paper

TY - GEN

T1 - (Mass) Sensitive High Resolution Microbeam Analysis Using a Scanning Ion Probe: The Next Step

AU - Griffin, Brendan

AU - Mcnaughton, N.

AU - Hillion, F.

PY - 2002

Y1 - 2002

M3 - Conference paper

SN - 095804080X

VL - one

SP - 35

BT - 17th Australian Conference on Electron Microscopy

A2 - Terlet, J.

A2 - Self, P.

A2 - Henderson, M.

A2 - Dayman, M.

PB - Australian Society for Electron Microscopy Inc.

CY - Adelaide, South Australia

ER -

Griffin B, Mcnaughton N, Hillion F. (Mass) Sensitive High Resolution Microbeam Analysis Using a Scanning Ion Probe: The Next Step. In Terlet J, Self P, Henderson M, Dayman M, editors, 17th Australian Conference on Electron Microscopy. Adelaide, South Australia ed. Vol. one. Adelaide, South Australia: Australian Society for Electron Microscopy Inc. 2002. p. 35