@inproceedings{d5742ee1565b4860b27771b0416d26d9,
title = "(Mass) Sensitive High Resolution Microbeam Analysis Using a Scanning Ion Probe: The Next Step",
author = "Brendan Griffin and N. Mcnaughton and F. Hillion",
year = "2002",
language = "English",
isbn = "095804080X",
volume = "one",
pages = "35",
editor = "J. Terlet and P. Self and M. Henderson and M. Dayman",
booktitle = "17th Australian Conference on Electron Microscopy",
publisher = "Australian Society for Electron Microscopy Inc.",
edition = "Adelaide, South Australia",
note = "(Mass) Sensitive High Resolution Microbeam Analysis Using a Scanning Ion Probe: The Next Step ; Conference date: 01-01-2002",
}