| Original language | English |
|---|---|
| Title of host publication | 17th Australian Conference on Electron Microscopy |
| Editors | J. Terlet, P. Self, M. Henderson, M. Dayman |
| Place of Publication | Adelaide, South Australia |
| Publisher | Australian Society for Electron Microscopy Inc. |
| Pages | 35 |
| Volume | one |
| Edition | Adelaide, South Australia |
| ISBN (Print) | 095804080X |
| Publication status | Published - 2002 |
| Event | (Mass) Sensitive High Resolution Microbeam Analysis Using a Scanning Ion Probe: The Next Step - Adelaide, South Australia Duration: 1 Jan 2002 → … |
Conference
| Conference | (Mass) Sensitive High Resolution Microbeam Analysis Using a Scanning Ion Probe: The Next Step |
|---|---|
| Period | 1/01/02 → … |
Cite this
Griffin, B., Mcnaughton, N., & Hillion, F. (2002). (Mass) Sensitive High Resolution Microbeam Analysis Using a Scanning Ion Probe: The Next Step. In J. Terlet, P. Self, M. Henderson, & M. Dayman (Eds.), 17th Australian Conference on Electron Microscopy (Adelaide, South Australia ed., Vol. one, pp. 35). Adelaide, South Australia: Australian Society for Electron Microscopy Inc..
@inproceedings{d5742ee1565b4860b27771b0416d26d9,
title = "(Mass) Sensitive High Resolution Microbeam Analysis Using a Scanning Ion Probe: The Next Step",
author = "Brendan Griffin and N. Mcnaughton and F. Hillion",
year = "2002",
language = "English",
isbn = "095804080X",
volume = "one",
pages = "35",
editor = "J. Terlet and P. Self and M. Henderson and M. Dayman",
booktitle = "17th Australian Conference on Electron Microscopy",
publisher = "Australian Society for Electron Microscopy Inc.",
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}
Griffin, B, Mcnaughton, N & Hillion, F 2002, (Mass) Sensitive High Resolution Microbeam Analysis Using a Scanning Ion Probe: The Next Step. in J Terlet, P Self, M Henderson & M Dayman (eds), 17th Australian Conference on Electron Microscopy. Adelaide, South Australia edn, vol. one, Australian Society for Electron Microscopy Inc., Adelaide, South Australia, pp. 35, (Mass) Sensitive High Resolution Microbeam Analysis Using a Scanning Ion Probe: The Next Step, 1/01/02.
(Mass) Sensitive High Resolution Microbeam Analysis Using a Scanning Ion Probe: The Next Step. / Griffin, Brendan; Mcnaughton, N.; Hillion, F.
17th Australian Conference on Electron Microscopy. ed. / J. Terlet; P. Self; M. Henderson; M. Dayman. Vol. one Adelaide, South Australia. ed. Adelaide, South Australia : Australian Society for Electron Microscopy Inc., 2002. p. 35.Research output: Chapter in Book/Conference paper › Conference paper
TY - GEN
T1 - (Mass) Sensitive High Resolution Microbeam Analysis Using a Scanning Ion Probe: The Next Step
AU - Griffin, Brendan
AU - Mcnaughton, N.
AU - Hillion, F.
PY - 2002
Y1 - 2002
M3 - Conference paper
SN - 095804080X
VL - one
SP - 35
BT - 17th Australian Conference on Electron Microscopy
A2 - Terlet, J.
A2 - Self, P.
A2 - Henderson, M.
A2 - Dayman, M.
PB - Australian Society for Electron Microscopy Inc.
CY - Adelaide, South Australia
ER -
Griffin B, Mcnaughton N, Hillion F. (Mass) Sensitive High Resolution Microbeam Analysis Using a Scanning Ion Probe: The Next Step. In Terlet J, Self P, Henderson M, Dayman M, editors, 17th Australian Conference on Electron Microscopy. Adelaide, South Australia ed. Vol. one. Adelaide, South Australia: Australian Society for Electron Microscopy Inc. 2002. p. 35