(Mass) Sensitive High Resolution Microbeam Analysis Using a Scanning Ion Probe: The Next Step

Brendan Griffin; N. Mcnaughton; F. Hillion

(Mass) Sensitive High Resolution Microbeam Analysis Using a Scanning Ion Probe: The Next Step

Brendan Griffin, N. Mcnaughton, F. Hillion

Centre for Microscopy, Characterisation & Analysis

Research output: Chapter in Book/Conference paper › Conference paper

Original language	English
Title of host publication	17th Australian Conference on Electron Microscopy
Editors	J. Terlet, P. Self, M. Henderson, M. Dayman
Place of Publication	Adelaide, South Australia
Publisher	Australian Society for Electron Microscopy Inc.
Pages	35
Volume	one
Edition	Adelaide, South Australia
ISBN (Print)	095804080X
Publication status	Published - 2002
Event	(Mass) Sensitive High Resolution Microbeam Analysis Using a Scanning Ion Probe: The Next Step - Adelaide, South Australia Duration: 1 Jan 2002 → …

Conference

Conference	(Mass) Sensitive High Resolution Microbeam Analysis Using a Scanning Ion Probe: The Next Step
Period	1/01/02 → …

Cite this

Griffin, Brendan ; Mcnaughton, N. ; Hillion, F. / (Mass) Sensitive High Resolution Microbeam Analysis Using a Scanning Ion Probe: The Next Step. 17th Australian Conference on Electron Microscopy. editor / J. Terlet ; P. Self ; M. Henderson ; M. Dayman. Vol. one Adelaide, South Australia. ed. Adelaide, South Australia : Australian Society for Electron Microscopy Inc., 2002. pp. 35

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title = "(Mass) Sensitive High Resolution Microbeam Analysis Using a Scanning Ion Probe: The Next Step",

author = "Brendan Griffin and N. Mcnaughton and F. Hillion",

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volume = "one",

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booktitle = "17th Australian Conference on Electron Microscopy",

publisher = "Australian Society for Electron Microscopy Inc.",

edition = "Adelaide, South Australia",

note = "(Mass) Sensitive High Resolution Microbeam Analysis Using a Scanning Ion Probe: The Next Step ; Conference date: 01-01-2002",

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Griffin, B, Mcnaughton, N & Hillion, F 2002, (Mass) Sensitive High Resolution Microbeam Analysis Using a Scanning Ion Probe: The Next Step. in J Terlet, P Self, M Henderson & M Dayman (eds), 17th Australian Conference on Electron Microscopy. Adelaide, South Australia edn, vol. one, Australian Society for Electron Microscopy Inc., Adelaide, South Australia, pp. 35, (Mass) Sensitive High Resolution Microbeam Analysis Using a Scanning Ion Probe: The Next Step, 1/01/02.

(Mass) Sensitive High Resolution Microbeam Analysis Using a Scanning Ion Probe: The Next Step. / Griffin, Brendan; Mcnaughton, N.; Hillion, F.

17th Australian Conference on Electron Microscopy. ed. / J. Terlet; P. Self; M. Henderson; M. Dayman. Vol. one Adelaide, South Australia. ed. Adelaide, South Australia : Australian Society for Electron Microscopy Inc., 2002. p. 35.

Research output: Chapter in Book/Conference paper › Conference paper

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T1 - (Mass) Sensitive High Resolution Microbeam Analysis Using a Scanning Ion Probe: The Next Step

AU - Griffin, Brendan

AU - Mcnaughton, N.

AU - Hillion, F.

PY - 2002

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M3 - Conference paper

SN - 095804080X

VL - one

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BT - 17th Australian Conference on Electron Microscopy

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A2 - Self, P.

A2 - Henderson, M.

A2 - Dayman, M.

PB - Australian Society for Electron Microscopy Inc.

CY - Adelaide, South Australia

T2 - (Mass) Sensitive High Resolution Microbeam Analysis Using a Scanning Ion Probe: The Next Step

Y2 - 1 January 2002

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