Low Voltage Microanalysis of Focused Ion Beam Implanted Samples in the ESEM

T.C. Baroni; Brendan Griffin; F.J. Lincoln

Low Voltage Microanalysis of Focused Ion Beam Implanted Samples in the ESEM

T.C. Baroni, Brendan Griffin, F.J. Lincoln

Centre for Microscopy, Characterisation & Analysis

Research output: Chapter in Book/Conference paper › Conference paper

Original language	English
Title of host publication	17th Australian Conference on Electron Microscopy
Editors	J. Terlet, P. Self, M. Henderson, M. Dayman
Place of Publication	Adelaide, South Australia
Publisher	Australian Society for Electron Microscopy Inc.
Pages	113-114
Volume	One
Edition	Adelaide, South Australia
ISBN (Print)	095804080X
Publication status	Published - 2002
Event	Low Voltage Microanalysis of Focused Ion Beam Implanted Samples in the ESEM - Adelaide, South Australia Duration: 1 Jan 2002 → …

Conference

Conference	Low Voltage Microanalysis of Focused Ion Beam Implanted Samples in the ESEM
Period	1/01/02 → …

Cite this

Baroni, T.C. ; Griffin, Brendan ; Lincoln, F.J. / Low Voltage Microanalysis of Focused Ion Beam Implanted Samples in the ESEM. 17th Australian Conference on Electron Microscopy. editor / J. Terlet ; P. Self ; M. Henderson ; M. Dayman. Vol. One Adelaide, South Australia. ed. Adelaide, South Australia : Australian Society for Electron Microscopy Inc., 2002. pp. 113-114

@inproceedings{fba95c8c4075438091dfd1024da3bcdd,

title = "Low Voltage Microanalysis of Focused Ion Beam Implanted Samples in the ESEM",

author = "T.C. Baroni and Brendan Griffin and F.J. Lincoln",

year = "2002",

language = "English",

isbn = "095804080X",

volume = "One",

pages = "113--114",

editor = "J. Terlet and P. Self and M. Henderson and M. Dayman",

booktitle = "17th Australian Conference on Electron Microscopy",

publisher = "Australian Society for Electron Microscopy Inc.",

edition = "Adelaide, South Australia",

note = "Low Voltage Microanalysis of Focused Ion Beam Implanted Samples in the ESEM ; Conference date: 01-01-2002",

}

Baroni, TC, Griffin, B & Lincoln, FJ 2002, Low Voltage Microanalysis of Focused Ion Beam Implanted Samples in the ESEM. in J Terlet, P Self, M Henderson & M Dayman (eds), 17th Australian Conference on Electron Microscopy. Adelaide, South Australia edn, vol. One, Australian Society for Electron Microscopy Inc., Adelaide, South Australia, pp. 113-114, Low Voltage Microanalysis of Focused Ion Beam Implanted Samples in the ESEM, 1/01/02.

Low Voltage Microanalysis of Focused Ion Beam Implanted Samples in the ESEM. / Baroni, T.C.; Griffin, Brendan; Lincoln, F.J.
17th Australian Conference on Electron Microscopy. ed. / J. Terlet; P. Self; M. Henderson; M. Dayman. Vol. One Adelaide, South Australia. ed. Adelaide, South Australia: Australian Society for Electron Microscopy Inc., 2002. p. 113-114.

Research output: Chapter in Book/Conference paper › Conference paper

TY - GEN

T1 - Low Voltage Microanalysis of Focused Ion Beam Implanted Samples in the ESEM

AU - Baroni, T.C.

AU - Griffin, Brendan

AU - Lincoln, F.J.

PY - 2002

Y1 - 2002

M3 - Conference paper

SN - 095804080X

VL - One

SP - 113

EP - 114

BT - 17th Australian Conference on Electron Microscopy

A2 - Terlet, J.

A2 - Self, P.

A2 - Henderson, M.

A2 - Dayman, M.

PB - Australian Society for Electron Microscopy Inc.

CY - Adelaide, South Australia

T2 - Low Voltage Microanalysis of Focused Ion Beam Implanted Samples in the ESEM

Y2 - 1 January 2002

ER -