Low Temperature Through-Wafer Reactive Ion Etching for MEMS

Research output: Chapter in Book/Conference paperConference paperpeer-review

Original languageEnglish
Title of host publicationProceedings of the 2014 Conference on Optoelectronic and Microelectronic Materials & Devices (COMMAD 2014)
Place of PublicationUnited States of America
PublisherIEEE, Institute of Electrical and Electronics Engineers
Pages83-86
Volume1
ISBN (Print)9781479968671
Publication statusPublished - 2014
EventLow Temperature Through-Wafer Reactive Ion Etching for MEMS - Perth, Western Australia
Duration: 1 Jan 2014 → …

Conference

ConferenceLow Temperature Through-Wafer Reactive Ion Etching for MEMS
Period1/01/14 → …

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