Long-term reliability of lead-free electronic systems

G.P. Pandian, G.K. Ramaswami, Melinda Hodkiewicz, Edward Cripps, M. Pecht

Research output: Chapter in Book/Conference paperConference paperpeer-review

Abstract

© 2016 IEEE.Industries that have been excluded from being required to transition to lead-free electronics (based on RoHs legislation) are nevertheless under economic pressure to transition. However, they are hesitant due to the unavailability of long-term reliability data. This study investigates degradation mechanisms of lead-free electronics systems that were used or stored for 10 years in laboratory conditions. A series of system diagnosis were conducted to evaluate the overall functional health of these computer systems. Accelerated life-time model from the literature was used to estimate the lifetime of the systems using their operating conditions input. These results were compared with current functionality status of the systems.
Original languageEnglish
Title of host publicationProceedings of the 2016 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits
EditorsVinod Narang
Place of PublicationUSA
PublisherIEEE, Institute of Electrical and Electronics Engineers
Pages305-311
Number of pages7
ISBN (Electronic)9781467382588
ISBN (Print)9781467382588
DOIs
Publication statusPublished - 9 Sept 2016
Event23rd IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits: IPFA 2016 - Singapore, Singapore
Duration: 18 Jul 201621 Jul 2016

Conference

Conference23rd IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits
Country/TerritorySingapore
CitySingapore
Period18/07/1621/07/16

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