Laser beam induced current technique as a quantitative tool for HgCdTe photodiode characterisation

Charles Musca, D.A. Redfern, John Dell, Lorenzo Faraone

Research output: Chapter in Book/Conference paperConference paper

Original languageEnglish
Title of host publicationProceedings of SPIE - Design, Characterization, and Packaging for MEMS and Microelectronics
EditorsB. Courois, S. Demidenko
Place of PublicationBellingham, Washington, USA
PublisherSPIE
Pages334-343
Volume3893
EditionRoyal Pines Resort, Queensland
ISBN (Print)0819434949
Publication statusPublished - 1999
EventLaser beam induced current technique as a quantitative tool for HgCdTe photodiode characterisation - Royal Pines Resort, Queensland
Duration: 1 Jan 1999 → …

Conference

ConferenceLaser beam induced current technique as a quantitative tool for HgCdTe photodiode characterisation
Period1/01/99 → …

Cite this

Musca, C., Redfern, D. A., Dell, J., & Faraone, L. (1999). Laser beam induced current technique as a quantitative tool for HgCdTe photodiode characterisation. In B. Courois, & S. Demidenko (Eds.), Proceedings of SPIE - Design, Characterization, and Packaging for MEMS and Microelectronics (Royal Pines Resort, Queensland ed., Vol. 3893, pp. 334-343). SPIE.