Laser beam induced current technique as a quantitative tool for HgCdTe photodiode characterisation

Charles Musca; D.A. Redfern; John Dell; Lorenzo Faraone

Laser beam induced current technique as a quantitative tool for HgCdTe photodiode characterisation

Charles Musca, D.A. Redfern, John Dell, Lorenzo Faraone

Graduate Research School

Research output: Chapter in Book/Conference paper › Conference paper › peer-review

Original language	English
Title of host publication	Proceedings of SPIE - Design, Characterization, and Packaging for MEMS and Microelectronics
Editors	B. Courois, S. Demidenko
Place of Publication	Bellingham, Washington, USA
Publisher	SPIE
Pages	334-343
Volume	3893
Edition	Royal Pines Resort, Queensland
ISBN (Print)	0819434949
Publication status	Published - 1999
Event	Laser beam induced current technique as a quantitative tool for HgCdTe photodiode characterisation - Royal Pines Resort, Queensland Duration: 1 Jan 1999 → …

Conference

Conference	Laser beam induced current technique as a quantitative tool for HgCdTe photodiode characterisation
Period	1/01/99 → …

Cite this

Musca, Charles ; Redfern, D.A. ; Dell, John et al. / Laser beam induced current technique as a quantitative tool for HgCdTe photodiode characterisation. Proceedings of SPIE - Design, Characterization, and Packaging for MEMS and Microelectronics. editor / B. Courois ; S. Demidenko. Vol. 3893 Royal Pines Resort, Queensland. ed. Bellingham, Washington, USA : SPIE, 1999. pp. 334-343

@inproceedings{49f6167628b1473b8dab3b11acd86125,

title = "Laser beam induced current technique as a quantitative tool for HgCdTe photodiode characterisation",

author = "Charles Musca and D.A. Redfern and John Dell and Lorenzo Faraone",

year = "1999",

language = "English",

isbn = "0819434949",

volume = "3893",

pages = "334--343",

editor = "B. Courois and S. Demidenko",

booktitle = "Proceedings of SPIE - Design, Characterization, and Packaging for MEMS and Microelectronics",

publisher = "SPIE",

address = "United States",

edition = "Royal Pines Resort, Queensland",

note = "Laser beam induced current technique as a quantitative tool for HgCdTe photodiode characterisation ; Conference date: 01-01-1999",

}

Musca, C, Redfern, DA, Dell, J & Faraone, L 1999, Laser beam induced current technique as a quantitative tool for HgCdTe photodiode characterisation. in B Courois & S Demidenko (eds), Proceedings of SPIE - Design, Characterization, and Packaging for MEMS and Microelectronics. Royal Pines Resort, Queensland edn, vol. 3893, SPIE, Bellingham, Washington, USA, pp. 334-343, Laser beam induced current technique as a quantitative tool for HgCdTe photodiode characterisation, 1/01/99.

Laser beam induced current technique as a quantitative tool for HgCdTe photodiode characterisation. / Musca, Charles; Redfern, D.A.; Dell, John et al.
Proceedings of SPIE - Design, Characterization, and Packaging for MEMS and Microelectronics. ed. / B. Courois; S. Demidenko. Vol. 3893 Royal Pines Resort, Queensland. ed. Bellingham, Washington, USA: SPIE, 1999. p. 334-343.

Research output: Chapter in Book/Conference paper › Conference paper › peer-review

TY - GEN

T1 - Laser beam induced current technique as a quantitative tool for HgCdTe photodiode characterisation

AU - Musca, Charles

AU - Redfern, D.A.

AU - Dell, John

AU - Faraone, Lorenzo

PY - 1999

Y1 - 1999

M3 - Conference paper

SN - 0819434949

VL - 3893

SP - 334

EP - 343

BT - Proceedings of SPIE - Design, Characterization, and Packaging for MEMS and Microelectronics

A2 - Courois, B.

A2 - Demidenko, S.

PB - SPIE

CY - Bellingham, Washington, USA

T2 - Laser beam induced current technique as a quantitative tool for HgCdTe photodiode characterisation

Y2 - 1 January 1999

ER -