Laser beam induced current for qualitative evaluation of HgCdTe van der Pauw sample uniformity

B.A. Park; R.J. Westerhout; Gordon Tsen; Charles Musca; John Dell; Lorenzo Faraone

Laser beam induced current for qualitative evaluation of HgCdTe van der Pauw sample uniformity

B.A. Park, R.J. Westerhout, Gordon Tsen, Charles Musca, John Dell, Lorenzo Faraone

Graduate Research School

Research output: Chapter in Book/Conference paper › Conference paper › peer-review

Original language	English
Title of host publication	Proceedings of the 2008 Conference on Optoelectronic and Microelectronic Materials and Devices
Editors	Lorenzo Faraone, Michael Cortie, Andres Cuevas, John Dell, Chennupati Jagadish, Martin Kocan, Barry Luther-Davies, Mariu
Place of Publication	USA
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	108-113
Volume	CD-ROM
Edition	Sydney, Australia
ISBN (Print)	9781424427178
Publication status	Published - 2008
Event	Laser beam induced current for qualitative evaluation of HgCdTe van der Pauw sample uniformity - Sydney, Australia Duration: 1 Jan 2008 → …

Conference

Conference	Laser beam induced current for qualitative evaluation of HgCdTe van der Pauw sample uniformity
Period	1/01/08 → …

Cite this

Park, B. A., Westerhout, R. J., Tsen, G., Musca, C., Dell, J., & Faraone, L. (2008). Laser beam induced current for qualitative evaluation of HgCdTe van der Pauw sample uniformity. In L. Faraone, M. Cortie, A. Cuevas, J. Dell, C. Jagadish, M. Kocan, B. Luther-Davies, & Mariu (Eds.), Proceedings of the 2008 Conference on Optoelectronic and Microelectronic Materials and Devices (Sydney, Australia ed., Vol. CD-ROM, pp. 108-113). IEEE, Institute of Electrical and Electronics Engineers.

Park, B.A. ; Westerhout, R.J. ; Tsen, Gordon et al. / Laser beam induced current for qualitative evaluation of HgCdTe van der Pauw sample uniformity. Proceedings of the 2008 Conference on Optoelectronic and Microelectronic Materials and Devices. editor / Lorenzo Faraone ; Michael Cortie ; Andres Cuevas ; John Dell ; Chennupati Jagadish ; Martin Kocan ; Barry Luther-Davies ; Mariu. Vol. CD-ROM Sydney, Australia. ed. USA : IEEE, Institute of Electrical and Electronics Engineers, 2008. pp. 108-113

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title = "Laser beam induced current for qualitative evaluation of HgCdTe van der Pauw sample uniformity",

author = "B.A. Park and R.J. Westerhout and Gordon Tsen and Charles Musca and John Dell and Lorenzo Faraone",

year = "2008",

language = "English",

isbn = "9781424427178",

volume = "CD-ROM",

pages = "108--113",

editor = "Lorenzo Faraone and Michael Cortie and Andres Cuevas and John Dell and Chennupati Jagadish and Martin Kocan and Barry Luther-Davies and Mariu",

booktitle = "Proceedings of the 2008 Conference on Optoelectronic and Microelectronic Materials and Devices",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

address = "United States",

edition = "Sydney, Australia",

note = "Laser beam induced current for qualitative evaluation of HgCdTe van der Pauw sample uniformity ; Conference date: 01-01-2008",

}

Park, BA, Westerhout, RJ, Tsen, G, Musca, C, Dell, J & Faraone, L 2008, Laser beam induced current for qualitative evaluation of HgCdTe van der Pauw sample uniformity. in L Faraone, M Cortie, A Cuevas, J Dell, C Jagadish, M Kocan, B Luther-Davies & Mariu (eds), Proceedings of the 2008 Conference on Optoelectronic and Microelectronic Materials and Devices. Sydney, Australia edn, vol. CD-ROM, IEEE, Institute of Electrical and Electronics Engineers, USA, pp. 108-113, Laser beam induced current for qualitative evaluation of HgCdTe van der Pauw sample uniformity, 1/01/08.

Laser beam induced current for qualitative evaluation of HgCdTe van der Pauw sample uniformity. / Park, B.A.; Westerhout, R.J.; Tsen, Gordon et al.
Proceedings of the 2008 Conference on Optoelectronic and Microelectronic Materials and Devices. ed. / Lorenzo Faraone; Michael Cortie; Andres Cuevas; John Dell; Chennupati Jagadish; Martin Kocan; Barry Luther-Davies; Mariu. Vol. CD-ROM Sydney, Australia. ed. USA: IEEE, Institute of Electrical and Electronics Engineers, 2008. p. 108-113.

Research output: Chapter in Book/Conference paper › Conference paper › peer-review

TY - GEN

T1 - Laser beam induced current for qualitative evaluation of HgCdTe van der Pauw sample uniformity

AU - Park, B.A.

AU - Westerhout, R.J.

AU - Tsen, Gordon

AU - Musca, Charles

AU - Dell, John

AU - Faraone, Lorenzo

PY - 2008

Y1 - 2008

M3 - Conference paper

SN - 9781424427178

VL - CD-ROM

SP - 108

EP - 113

BT - Proceedings of the 2008 Conference on Optoelectronic and Microelectronic Materials and Devices

A2 - Faraone, Lorenzo

A2 - Cortie, Michael

A2 - Cuevas, Andres

A2 - Dell, John

A2 - Jagadish, Chennupati

A2 - Kocan, Martin

A2 - Luther-Davies, Barry

A2 - Mariu, null

PB - IEEE, Institute of Electrical and Electronics Engineers

CY - USA

T2 - Laser beam induced current for qualitative evaluation of HgCdTe van der Pauw sample uniformity

Y2 - 1 January 2008

ER -

Park BA, Westerhout RJ, Tsen G, Musca C, Dell J , Faraone L. Laser beam induced current for qualitative evaluation of HgCdTe van der Pauw sample uniformity. In Faraone L, Cortie M, Cuevas A, Dell J, Jagadish C, Kocan M, Luther-Davies B, Mariu, editors, Proceedings of the 2008 Conference on Optoelectronic and Microelectronic Materials and Devices. Sydney, Australia ed. Vol. CD-ROM. USA: IEEE, Institute of Electrical and Electronics Engineers. 2008. p. 108-113