Junction Depth Measurement in HgCdTe Using Laser Beam Induced Current (LBIC)

Charles Musca, D.A. Redfern, E.P.G. Smith, John Dell, Lorenzo Faraone, J. Bajaj

Research output: Contribution to journalArticle

37 Citations (Scopus)
Original languageEnglish
Pages (from-to)603-610
JournalJournal of Electronic Materials
Volume28
Issue number6
Publication statusPublished - 1999

Cite this