Junction Depth Measurement in HgCdTe Using Laser Beam Induced Current (LBIC)

Charles Musca, D.A. Redfern, E.P.G. Smith, John Dell, Lorenzo Faraone, J. Bajaj

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	603-610
Journal	Journal of Electronic Materials
Volume	28
Issue number	6
Publication status	Published - 1999

Cite this

@article{48b2c864b72a40569e92c537624de606,

title = "Junction Depth Measurement in HgCdTe Using Laser Beam Induced Current (LBIC)",

author = "Charles Musca and D.A. Redfern and E.P.G. Smith and John Dell and Lorenzo Faraone and J. Bajaj",

year = "1999",

language = "English",

volume = "28",

pages = "603--610",

journal = "Journal of Electronic Materials",

issn = "0361-5235",

publisher = "Springer",

number = "6",

}