Is the spatial resolution of element x-ray mapping in insulators a variable of analysis point dwell time and electron beam current?

Brendan Griffin

Research output: Chapter in Book/Conference paperConference paper

Original languageEnglish
Title of host publicationProceedings of the Fourth Biennial Symposium on SEM Imaging and Analysis: Applications and Techniques
EditorsM. Greaves, I. Harrowfield, P. Miller, J. Ward
Place of PublicationMelbourne
PublisherCSIRO Forestry and Forest Products
Pages34-35
Volumen/a
EditionMelbourne
ISBN (Print)0 646 30077 6
Publication statusPublished - 1997
EventIs the spatial resolution of element x-ray mapping in insulators a variable of analysis point dwell time and electron beam current? - Melbourne
Duration: 1 Jan 1997 → …

Conference

ConferenceIs the spatial resolution of element x-ray mapping in insulators a variable of analysis point dwell time and electron beam current?
Period1/01/97 → …

Cite this

Griffin, B. (1997). Is the spatial resolution of element x-ray mapping in insulators a variable of analysis point dwell time and electron beam current? In M. Greaves, I. Harrowfield, P. Miller, & J. Ward (Eds.), Proceedings of the Fourth Biennial Symposium on SEM Imaging and Analysis: Applications and Techniques (Melbourne ed., Vol. n/a, pp. 34-35). CSIRO Forestry and Forest Products.