Investigation of aging effects in porous silicon

T.D. James; A. Steer; Charles Musca; Giacinta Parish; Adrian Keating; Lorenzo Faraone

Investigation of aging effects in porous silicon

T.D. James, A. Steer, Charles Musca, Giacinta Parish, Adrian Keating, Lorenzo Faraone

Research output: Chapter in Book/Conference paper › Conference paper › peer-review

Original language	English
Title of host publication	COMMAD '06 Proceedings of the 2006 Conference on Optoelectronic and Microelectronic Materials and Devices
Editors	Lorenzo Faraone, Sabine Betts, John Dell, Charles Musca, Brett Nener, Gia Parish, Justin Wehner
Place of Publication	United States of America
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	290-293
Volume	CD
Edition	Perth, Western Australia
ISBN (Print)	1424405785
Publication status	Published - 2007
Event	Investigation of aging effects in porous silicon - Perth, Western Australia Duration: 1 Jan 2007 → …

Conference

Conference	Investigation of aging effects in porous silicon
Period	1/01/07 → …

Cite this

James, T. D., Steer, A., Musca, C., Parish, G., Keating, A., & Faraone, L. (2007). Investigation of aging effects in porous silicon. In L. Faraone, S. Betts, J. Dell, C. Musca, B. Nener, G. Parish, & J. Wehner (Eds.), COMMAD '06 Proceedings of the 2006 Conference on Optoelectronic and Microelectronic Materials and Devices (Perth, Western Australia ed., Vol. CD, pp. 290-293). IEEE, Institute of Electrical and Electronics Engineers.

James, T.D. ; Steer, A. ; Musca, Charles et al. / Investigation of aging effects in porous silicon. COMMAD '06 Proceedings of the 2006 Conference on Optoelectronic and Microelectronic Materials and Devices. editor / Lorenzo Faraone ; Sabine Betts ; John Dell ; Charles Musca ; Brett Nener ; Gia Parish ; Justin Wehner. Vol. CD Perth, Western Australia. ed. United States of America : IEEE, Institute of Electrical and Electronics Engineers, 2007. pp. 290-293

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title = "Investigation of aging effects in porous silicon",

author = "T.D. James and A. Steer and Charles Musca and Giacinta Parish and Adrian Keating and Lorenzo Faraone",

year = "2007",

language = "English",

isbn = "1424405785",

volume = "CD",

pages = "290--293",

editor = "Lorenzo Faraone and Sabine Betts and John Dell and Charles Musca and Brett Nener and Gia Parish and Justin Wehner",

booktitle = "COMMAD '06 Proceedings of the 2006 Conference on Optoelectronic and Microelectronic Materials and Devices",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

address = "United States",

edition = "Perth, Western Australia",

note = "Investigation of aging effects in porous silicon ; Conference date: 01-01-2007",

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James, TD, Steer, A, Musca, C, Parish, G , Keating, A & Faraone, L 2007, Investigation of aging effects in porous silicon. in L Faraone, S Betts, J Dell, C Musca, B Nener, G Parish & J Wehner (eds), COMMAD '06 Proceedings of the 2006 Conference on Optoelectronic and Microelectronic Materials and Devices. Perth, Western Australia edn, vol. CD, IEEE, Institute of Electrical and Electronics Engineers, United States of America, pp. 290-293, Investigation of aging effects in porous silicon, 1/01/07.

Investigation of aging effects in porous silicon. / James, T.D.; Steer, A.; Musca, Charles et al.
COMMAD '06 Proceedings of the 2006 Conference on Optoelectronic and Microelectronic Materials and Devices. ed. / Lorenzo Faraone; Sabine Betts; John Dell; Charles Musca; Brett Nener; Gia Parish; Justin Wehner. Vol. CD Perth, Western Australia. ed. United States of America: IEEE, Institute of Electrical and Electronics Engineers, 2007. p. 290-293.

Research output: Chapter in Book/Conference paper › Conference paper › peer-review

TY - GEN

T1 - Investigation of aging effects in porous silicon

AU - James, T.D.

AU - Steer, A.

AU - Musca, Charles

AU - Parish, Giacinta

AU - Keating, Adrian

AU - Faraone, Lorenzo

PY - 2007

Y1 - 2007

M3 - Conference paper

SN - 1424405785

VL - CD

SP - 290

EP - 293

BT - COMMAD '06 Proceedings of the 2006 Conference on Optoelectronic and Microelectronic Materials and Devices

A2 - Faraone, Lorenzo

A2 - Betts, Sabine

A2 - Dell, John

A2 - Musca, Charles

A2 - Nener, Brett

A2 - Parish, Gia

A2 - Wehner, Justin

PB - IEEE, Institute of Electrical and Electronics Engineers

CY - United States of America

T2 - Investigation of aging effects in porous silicon

Y2 - 1 January 2007

ER -

James TD, Steer A, Musca C, Parish G , Keating A , Faraone L. Investigation of aging effects in porous silicon. In Faraone L, Betts S, Dell J, Musca C, Nener B, Parish G, Wehner J, editors, COMMAD '06 Proceedings of the 2006 Conference on Optoelectronic and Microelectronic Materials and Devices. Perth, Western Australia ed. Vol. CD. United States of America: IEEE, Institute of Electrical and Electronics Engineers. 2007. p. 290-293