Intra-operative terahertz probe for detection of breast cancer

A. Portieri, M. Grootendorst, Tony Fitzgerald

    Research output: Chapter in Book/Conference paperConference paper

    Abstract

    © 2015 IEEE.A handheld THz probe has been developed by TeraView with the goal to assess tumor resection margins intra-operatively in breast-conserving surgery (BCS) specimens and metastatic status of sentinel lymph nodes (SLNs), with a view to reduce re-operation rates. The utility of this probe for this purpose has already been shown in an ex vivo setting. Further work carried out by Teraview Ltd together with the breast surgical team at King's College London (KCL)/Guy's and St Thomas's NHS Foundation Trust (GSTT) is confirming promise of this technique, with focus on the in vivo application of the handheld THz probe for real-time assessment of tumor resection margins in BCS. In particualr, the probe is designed to acquire THz images during breast cancer surgery to distinguish between normal and malignant breast tissue, thus assisting complete surgical excision of cancers. Findings of this study leading to in-vivo testing are discussed in this paper.
    Original languageEnglish
    Title of host publication2015 8th UK, Europe, China Millimeter Waves and THz Technology Workshop
    EditorsPeter Hargrave
    PublisherIEEE, Institute of Electrical and Electronics Engineers
    ISBN (Print)9781467374347
    DOIs
    Publication statusPublished - 2016
    Event8th UK, Europe, China Millimeter Waves and THz Technology Workshop: UCMMT 2015 - Cardiff, United Kingdom
    Duration: 13 Sep 201515 Sep 2015

    Conference

    Conference8th UK, Europe, China Millimeter Waves and THz Technology Workshop
    CountryUnited Kingdom
    CityCardiff
    Period13/09/1515/09/15

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    Portieri, A., Grootendorst, M., & Fitzgerald, T. (2016). Intra-operative terahertz probe for detection of breast cancer. In P. Hargrave (Ed.), 2015 8th UK, Europe, China Millimeter Waves and THz Technology Workshop [7460611] IEEE, Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/UCMMT.2015.7460611