Intercomparison of permittivity measurement techniques for ferroelectric thin layers

P. Quéfféléc, V. Laur, A. Chevalier, Jean-Michel Le Floch, D. Passerieux, D. Cros, V. Madrangeas, A. Le Febvrier, S. Députier, M. Guilloux-Viry, G. Houzet, T. Lacrevaz, C. Bermond, B. Fléchet

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    Physics & Astronomy