Inline monitoring of paper thickness in an industrial setting

S. F. Busch, T. Probst, L. Duschek, R. Wilk, M. Voitsch, F. Fender, S. Lübbecke, G. Gärtner, V. P. Wallace, Martin Koch

    Research output: Chapter in Book/Conference paperConference paperpeer-review

    5 Citations (Scopus)

    Abstract

    We present a THz-TDS based inline monitoring system for quality control in the production of paper. The system provides accurate live data about the paper quality and thickness, and is directly connected to the production process control.

    Original languageEnglish
    Title of host publication2013 38th International Conference on Infrared, Millimeter, and Terahertz Waves
    EditorsRene Beigang
    PublisherIEEE, Institute of Electrical and Electronics Engineers
    ISBN (Print)9781467347174
    DOIs
    Publication statusPublished - 2013
    Event2013 38th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2013 - Mainz, Germany
    Duration: 1 Sep 20136 Sep 2013

    Conference

    Conference2013 38th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2013
    Country/TerritoryGermany
    CityMainz
    Period1/09/136/09/13

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