Inline monitoring of paper thickness in an industrial setting

S. F. Busch; T. Probst; L. Duschek; R. Wilk; M. Voitsch; F. Fender; S. Lübbecke; G. Gärtner; V. P. Wallace; Martin Koch

doi:10.1109/IRMMW-THz.2013.6665803

Inline monitoring of paper thickness in an industrial setting

S. F. Busch, T. Probst, L. Duschek, R. Wilk, M. Voitsch, F. Fender, S. Lübbecke, G. Gärtner, V. P. Wallace, Martin Koch

Research output: Chapter in Book/Conference paper › Conference paper › peer-review

5 Citations (Scopus)

Abstract

We present a THz-TDS based inline monitoring system for quality control in the production of paper. The system provides accurate live data about the paper quality and thickness, and is directly connected to the production process control.

Original language	English
Title of host publication	2013 38th International Conference on Infrared, Millimeter, and Terahertz Waves
Editors	Rene Beigang
Publisher	IEEE, Institute of Electrical and Electronics Engineers
ISBN (Print)	9781467347174
DOIs	https://doi.org/10.1109/IRMMW-THz.2013.6665803
Publication status	Published - 2013
Event	2013 38th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2013 - Mainz, Germany Duration: 1 Sept 2013 → 6 Sept 2013

Conference

Conference	2013 38th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2013
Country/Territory	Germany
City	Mainz
Period	1/09/13 → 6/09/13

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10.1109/IRMMW-THz.2013.6665803

Cite this

Busch, S. F., Probst, T., Duschek, L., Wilk, R., Voitsch, M., Fender, F., Lübbecke, S., Gärtner, G., Wallace, V. P., & Koch, M. (2013). Inline monitoring of paper thickness in an industrial setting. In R. Beigang (Ed.), 2013 38th International Conference on Infrared, Millimeter, and Terahertz Waves Article 6665803 IEEE, Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/IRMMW-THz.2013.6665803

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title = "Inline monitoring of paper thickness in an industrial setting",

abstract = "We present a THz-TDS based inline monitoring system for quality control in the production of paper. The system provides accurate live data about the paper quality and thickness, and is directly connected to the production process control.",

author = "Busch, {S. F.} and T. Probst and L. Duschek and R. Wilk and M. Voitsch and F. Fender and S. L{\"u}bbecke and G. G{\"a}rtner and Wallace, {V. P.} and Martin Koch",

year = "2013",

doi = "10.1109/IRMMW-THz.2013.6665803",

language = "English",

isbn = "9781467347174",

editor = "Rene Beigang",

booktitle = "2013 38th International Conference on Infrared, Millimeter, and Terahertz Waves",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

address = "United States",

note = "2013 38th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2013 ; Conference date: 01-09-2013 Through 06-09-2013",

}

Busch, SF, Probst, T, Duschek, L, Wilk, R, Voitsch, M, Fender, F, Lübbecke, S, Gärtner, G, Wallace, VP & Koch, M 2013, Inline monitoring of paper thickness in an industrial setting. in R Beigang (ed.), 2013 38th International Conference on Infrared, Millimeter, and Terahertz Waves., 6665803, IEEE, Institute of Electrical and Electronics Engineers, 2013 38th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2013, Mainz, Germany, 1/09/13. https://doi.org/10.1109/IRMMW-THz.2013.6665803

TY - GEN

T1 - Inline monitoring of paper thickness in an industrial setting

AU - Busch, S. F.

AU - Probst, T.

AU - Duschek, L.

AU - Wilk, R.

AU - Voitsch, M.

AU - Fender, F.

AU - Lübbecke, S.

AU - Gärtner, G.

AU - Wallace, V. P.

AU - Koch, Martin

PY - 2013

Y1 - 2013

N2 - We present a THz-TDS based inline monitoring system for quality control in the production of paper. The system provides accurate live data about the paper quality and thickness, and is directly connected to the production process control.

AB - We present a THz-TDS based inline monitoring system for quality control in the production of paper. The system provides accurate live data about the paper quality and thickness, and is directly connected to the production process control.

UR - http://www.scopus.com/inward/record.url?scp=84893347446&partnerID=8YFLogxK

U2 - 10.1109/IRMMW-THz.2013.6665803

DO - 10.1109/IRMMW-THz.2013.6665803

M3 - Conference paper

AN - SCOPUS:84893347446

SN - 9781467347174

BT - 2013 38th International Conference on Infrared, Millimeter, and Terahertz Waves

A2 - Beigang, Rene

PB - IEEE, Institute of Electrical and Electronics Engineers

T2 - 2013 38th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2013

Y2 - 1 September 2013 through 6 September 2013

ER -

Inline monitoring of paper thickness in an industrial setting

Abstract

Conference

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