Inline monitoring of paper thickness in an industrial setting

S. F. Busch, T. Probst, L. Duschek, R. Wilk, M. Voitsch, F. Fender, S. Lübbecke, G. Gärtner, V. P. Wallace, Martin Koch

    Research output: Chapter in Book/Conference paperConference paper

    2 Citations (Scopus)

    Abstract

    We present a THz-TDS based inline monitoring system for quality control in the production of paper. The system provides accurate live data about the paper quality and thickness, and is directly connected to the production process control.

    Original languageEnglish
    Title of host publication2013 38th International Conference on Infrared, Millimeter, and Terahertz Waves
    EditorsRene Beigang
    PublisherIEEE, Institute of Electrical and Electronics Engineers
    ISBN (Print)9781467347174
    DOIs
    Publication statusPublished - 2013
    Event2013 38th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2013 - Mainz, Germany
    Duration: 1 Sep 20136 Sep 2013

    Conference

    Conference2013 38th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2013
    CountryGermany
    CityMainz
    Period1/09/136/09/13

    Fingerprint

    Monitoring
    Process control
    Quality control

    Cite this

    Busch, S. F., Probst, T., Duschek, L., Wilk, R., Voitsch, M., Fender, F., ... Koch, M. (2013). Inline monitoring of paper thickness in an industrial setting. In R. Beigang (Ed.), 2013 38th International Conference on Infrared, Millimeter, and Terahertz Waves [6665803] IEEE, Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/IRMMW-THz.2013.6665803
    Busch, S. F. ; Probst, T. ; Duschek, L. ; Wilk, R. ; Voitsch, M. ; Fender, F. ; Lübbecke, S. ; Gärtner, G. ; Wallace, V. P. ; Koch, Martin. / Inline monitoring of paper thickness in an industrial setting. 2013 38th International Conference on Infrared, Millimeter, and Terahertz Waves. editor / Rene Beigang. IEEE, Institute of Electrical and Electronics Engineers, 2013.
    @inproceedings{36e672a3fdf44348967e6d8413d81149,
    title = "Inline monitoring of paper thickness in an industrial setting",
    abstract = "We present a THz-TDS based inline monitoring system for quality control in the production of paper. The system provides accurate live data about the paper quality and thickness, and is directly connected to the production process control.",
    author = "Busch, {S. F.} and T. Probst and L. Duschek and R. Wilk and M. Voitsch and F. Fender and S. L{\"u}bbecke and G. G{\"a}rtner and Wallace, {V. P.} and Martin Koch",
    year = "2013",
    doi = "10.1109/IRMMW-THz.2013.6665803",
    language = "English",
    isbn = "9781467347174",
    editor = "Rene Beigang",
    booktitle = "2013 38th International Conference on Infrared, Millimeter, and Terahertz Waves",
    publisher = "IEEE, Institute of Electrical and Electronics Engineers",
    address = "United States",

    }

    Busch, SF, Probst, T, Duschek, L, Wilk, R, Voitsch, M, Fender, F, Lübbecke, S, Gärtner, G, Wallace, VP & Koch, M 2013, Inline monitoring of paper thickness in an industrial setting. in R Beigang (ed.), 2013 38th International Conference on Infrared, Millimeter, and Terahertz Waves., 6665803, IEEE, Institute of Electrical and Electronics Engineers, 2013 38th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2013, Mainz, Germany, 1/09/13. https://doi.org/10.1109/IRMMW-THz.2013.6665803

    Inline monitoring of paper thickness in an industrial setting. / Busch, S. F.; Probst, T.; Duschek, L.; Wilk, R.; Voitsch, M.; Fender, F.; Lübbecke, S.; Gärtner, G.; Wallace, V. P.; Koch, Martin.

    2013 38th International Conference on Infrared, Millimeter, and Terahertz Waves. ed. / Rene Beigang. IEEE, Institute of Electrical and Electronics Engineers, 2013. 6665803.

    Research output: Chapter in Book/Conference paperConference paper

    TY - GEN

    T1 - Inline monitoring of paper thickness in an industrial setting

    AU - Busch, S. F.

    AU - Probst, T.

    AU - Duschek, L.

    AU - Wilk, R.

    AU - Voitsch, M.

    AU - Fender, F.

    AU - Lübbecke, S.

    AU - Gärtner, G.

    AU - Wallace, V. P.

    AU - Koch, Martin

    PY - 2013

    Y1 - 2013

    N2 - We present a THz-TDS based inline monitoring system for quality control in the production of paper. The system provides accurate live data about the paper quality and thickness, and is directly connected to the production process control.

    AB - We present a THz-TDS based inline monitoring system for quality control in the production of paper. The system provides accurate live data about the paper quality and thickness, and is directly connected to the production process control.

    UR - http://www.scopus.com/inward/record.url?scp=84893347446&partnerID=8YFLogxK

    U2 - 10.1109/IRMMW-THz.2013.6665803

    DO - 10.1109/IRMMW-THz.2013.6665803

    M3 - Conference paper

    SN - 9781467347174

    BT - 2013 38th International Conference on Infrared, Millimeter, and Terahertz Waves

    A2 - Beigang, Rene

    PB - IEEE, Institute of Electrical and Electronics Engineers

    ER -

    Busch SF, Probst T, Duschek L, Wilk R, Voitsch M, Fender F et al. Inline monitoring of paper thickness in an industrial setting. In Beigang R, editor, 2013 38th International Conference on Infrared, Millimeter, and Terahertz Waves. IEEE, Institute of Electrical and Electronics Engineers. 2013. 6665803 https://doi.org/10.1109/IRMMW-THz.2013.6665803