Abstract
Atomic force microscopy (AFM) force profiling is used to investigate the sof adsorbed and solvation layers formed on a mica surface by various room temperature ionic liquids (ILs) ethylammonium nitrate (EAN), ethanolammonium nitrate (EtAN), ethylammonium formate (EAF), propylammonium formate (PAF), ethylmethylammonium (EMAF), and dimethylethylammonium formate (DMEAF). At least seven layers are observed for EAN at 14 °C (melting point 13 °C), decreasing as the temperature is increased to 30 °C due to thermal energy disrupting solvophobic forces that lto segregation of cation alkyl tails from the charged ammonium and nitrate moieties. The number and properties of the solvation layers can also be controlled by introducing an alcohol moiety to the cation's alkyl tail (EtAN), or by replacing the nitrat anion with formate (EAF and PAF), even leading to the detection of distinct cation and anion sublayers. Substitution of primary by secondary or tertiary ammonium cations reduces the number of solvation layers formed, and also weakens the cation layer adsonto mica. The observed solvation and adsorbed layer structures are discussed in terms of the intermolecular cohesive forces within the ILs.
| Original language | English |
|---|---|
| Pages (from-to) | 5961-5966 |
| Number of pages | 6 |
| Journal | Journal of Physical Chemistry B |
| Volume | 113 |
| Issue number | 17 |
| DOIs | |
| Publication status | Published - 30 Apr 2009 |
| Externally published | Yes |
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