In situ thickness and temperature measurements of CdTe grown by molecular beam epitaxy on GaAs substrate

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	041203-1 - 041203-4
Journal	Journal of Vacuum Science & Technology B
Volume	30
Issue number	4
DOIs	https://doi.org/10.1116/1.4718777
Publication status	Published - 2012

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@article{0fd986d5ca7443db861ca804ab1c153f,

title = "In situ thickness and temperature measurements of CdTe grown by molecular beam epitaxy on GaAs substrate",

author = "Renjie Gu and C. Shen and Y. Guo and W. Wang and X. Fu and L. Chen",

year = "2012",

doi = "10.1116/1.4718777",

language = "English",

volume = "30",

pages = "041203--1 -- 041203--4",

journal = "Journal of Vacuum Science \& Technology B",

issn = "1071-1023",

publisher = "AVS Science and Technology Society",

number = "4",

}

TY - JOUR

T1 - In situ thickness and temperature measurements of CdTe grown by molecular beam epitaxy on GaAs substrate

AU - Gu, Renjie

AU - Shen, C.

AU - Guo, Y.

AU - Wang, W.

AU - Fu, X.

AU - Chen, L.

PY - 2012

Y1 - 2012

U2 - 10.1116/1.4718777

DO - 10.1116/1.4718777

M3 - Article

SN - 1071-1023

VL - 30

SP - 041203-1 - 041203-4

JO - Journal of Vacuum Science & Technology B

JF - Journal of Vacuum Science & Technology B

IS - 4

ER -