Improved sample characterization in terahertz reflection imaging and spectroscopy

S. Huang, P.C. Ashworth, K.W.C. Kan, Y. Chen, Vincent Wallace, Y. Zhang, E. Pickwell-Macpherson

    Research output: Contribution to journal › Article

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    Abstract

    For imaging applications involving biological subjects, the strong attenuation of terahertz radiation by water means that terahertz pulsed imaging is most likely to be successfully implemented in a reflection geometry. Many terahertz reflection geometry systems have a window onto which the sample is placed – this window may introduce unwanted reflections which interfere with the reflection of interest from the sample. In this paper we derive a new approach to account for the effects of these reflections and illustrate its success with improved calculations of sample optical properties.© 2009 Optical Society of America
    Original languageEnglish
    Pages (from-to)3848-3854
    JournalOptics Express
    Volume17
    Issue number5
    DOIs
    Publication statusPublished - 2009

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    spectroscopy
    geometry
    attenuation
    optical properties
    radiation
    water

    Cite this

    Huang, S., Ashworth, P. C., Kan, K. W. C., Chen, Y., Wallace, V., Zhang, Y., & Pickwell-Macpherson, E. (2009). Improved sample characterization in terahertz reflection imaging and spectroscopy. Optics Express, 17(5), 3848-3854. https://doi.org/10.1364/OE.17.003848
    Huang, S. ; Ashworth, P.C. ; Kan, K.W.C. ; Chen, Y. ; Wallace, Vincent ; Zhang, Y. ; Pickwell-Macpherson, E. / Improved sample characterization in terahertz reflection imaging and spectroscopy. In: Optics Express. 2009 ; Vol. 17, No. 5. pp. 3848-3854.
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    Huang, S, Ashworth, PC, Kan, KWC, Chen, Y, Wallace, V, Zhang, Y & Pickwell-Macpherson, E 2009, 'Improved sample characterization in terahertz reflection imaging and spectroscopy' Optics Express, vol. 17, no. 5, pp. 3848-3854. https://doi.org/10.1364/OE.17.003848

    Improved sample characterization in terahertz reflection imaging and spectroscopy. / Huang, S.; Ashworth, P.C.; Kan, K.W.C.; Chen, Y.; Wallace, Vincent; Zhang, Y.; Pickwell-Macpherson, E.

    In: Optics Express, Vol. 17, No. 5, 2009, p. 3848-3854.

    Research output: Contribution to journal › Article

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    AU - Zhang, Y.

    AU - Pickwell-Macpherson, E.

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    DO - 10.1364/OE.17.003848

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    Huang S, Ashworth PC, Kan KWC, Chen Y, Wallace V, Zhang Y et al. Improved sample characterization in terahertz reflection imaging and spectroscopy. Optics Express. 2009;17(5):3848-3854. https://doi.org/10.1364/OE.17.003848

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