Improved particle location and isotopic screening measurements of sub-micron sized particles by secondary ion mass spectrometry

P.M.L. Hedberg, P. Peres, John Cliff, F. Rabemananjara, Sten Littmann, H. Thiele, C. Vincent, N. Albert

Research output: Contribution to journal › Article › peer-review

36 Citations (Scopus)

Original language	English
Pages (from-to)	406-413
Journal	Journal of Analytical Atomic Spectrometry
Volume	26
DOIs	https://doi.org/10.1039/c0ja00181c
Publication status	Published - 2011

Access to Document

@article{13269e8da8914665bd82cec721350a50,

title = "Improved particle location and isotopic screening measurements of sub-micron sized particles by secondary ion mass spectrometry",

author = "P.M.L. Hedberg and P. Peres and John Cliff and F. Rabemananjara and Sten Littmann and H. Thiele and C. Vincent and N. Albert",

year = "2011",

doi = "10.1039/c0ja00181c",

language = "English",

volume = "26",

pages = "406--413",

journal = "Journal of Analytical Atomic Spectometry",

issn = "0267-9477",

publisher = "The Royal Society of Chemistry",

}

Research output: Contribution to journal › Article › peer-review

TY - JOUR

T1 - Improved particle location and isotopic screening measurements of sub-micron sized particles by secondary ion mass spectrometry

AU - Hedberg, P.M.L.

AU - Peres, P.

AU - Cliff, John

AU - Rabemananjara, F.

AU - Littmann, Sten

AU - Thiele, H.

AU - Vincent, C.

AU - Albert, N.

PY - 2011

Y1 - 2011

U2 - 10.1039/c0ja00181c

DO - 10.1039/c0ja00181c

M3 - Article

VL - 26

SP - 406

EP - 413

JO - Journal of Analytical Atomic Spectometry

JF - Journal of Analytical Atomic Spectometry

SN - 0267-9477

ER -