Original language | English |
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Pages (from-to) | 406-413 |
Journal | Journal of Analytical Atomic Spectrometry |
Volume | 26 |
DOIs | |
Publication status | Published - 2011 |
Improved particle location and isotopic screening measurements of sub-micron sized particles by secondary ion mass spectrometry
P.M.L. Hedberg, P. Peres, John Cliff, F. Rabemananjara, Sten Littmann, H. Thiele, C. Vincent, N. Albert
Research output: Contribution to journal › Article › peer-review
36
Citations
(Scopus)