Improved particle location and isotopic screening measurements of sub-micron sized particles by secondary ion mass spectrometry

P.M.L. Hedberg, P. Peres, John Cliff, F. Rabemananjara, Sten Littmann, H. Thiele, C. Vincent, N. Albert

Research output: Contribution to journalArticle

32 Citations (Scopus)
Original languageEnglish
Pages (from-to)406-413
JournalJournal of Analytical Atomic Spectrometry
Volume26
DOIs
Publication statusPublished - 2011

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