Abstract
Fluctuations in atmospheric emission introduce noise and systematic errors into measurements of polarization at far- infrared and submillimeter wavelengths. We describe a new analysis method that corrects for the bias and reduces the errors caused by the fluctuations. The method exploits repeated observations of a source and is especially effective on faint sources for which the polarized flux is on the same order as the atmospheric fluctuations.
| Original language | English |
|---|---|
| Pages (from-to) | 991-995 |
| Journal | Publications of the Astronomical Society of the Pacific |
| Volume | 117 |
| Issue number | 835 |
| DOIs | |
| Publication status | Published - 2005 |