Fluctuations in atmospheric emission introduce noise and systematic errors into measurements of polarization at far- infrared and submillimeter wavelengths. We describe a new analysis method that corrects for the bias and reduces the errors caused by the fluctuations. The method exploits repeated observations of a source and is especially effective on faint sources for which the polarized flux is on the same order as the atmospheric fluctuations.
|Journal||Publications of the Astronomical Society of the Pacific|
|Publication status||Published - 2005|