Abstract
Fluctuations in atmospheric emission introduce noise and systematic errors into measurements of polarization at far- infrared and submillimeter wavelengths. We describe a new analysis method that corrects for the bias and reduces the errors caused by the fluctuations. The method exploits repeated observations of a source and is especially effective on faint sources for which the polarized flux is on the same order as the atmospheric fluctuations.
Original language | English |
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Pages (from-to) | 991-995 |
Journal | Publications of the Astronomical Society of the Pacific |
Volume | 117 |
Issue number | 835 |
DOIs | |
Publication status | Published - 2005 |