Improved cryogenic sapphire oscillator with exceptionally high frequency stability

S. Chang; Anthony Mann; Andre Luiten

doi:10.1049/el:20000338

Improved cryogenic sapphire oscillator with exceptionally high frequency stability

S. Chang, Anthony Mann, Andre Luiten

Graduate Research School

Research output: Contribution to journal › Article › peer-review

66 Citations (Scopus)

Abstract

Extremely high short term frequency stability has been realised in oscillators based on liquid helium cooled sapphire resonators with a modified mounting structure. These oscillators have exhibited a fractional frequency stability (Allan deviation) of similar to 5.4 x 10(-16)tau(1/2) for integration times (a of 1-4s and a minimum Allan frequency deviation of 2.4 x 10(16) at 32s. For integration times greater than 100s the oscillator frequency stability degrades approximately as 3 x 10(-17)tau(1/2) This is the best stability reported to date for any frequency standard over integration times of 1-100s.

Original language	English
Pages (from-to)	480-481
Journal	Electronics Letters
Volume	36
Issue number	5
DOIs	https://doi.org/10.1049/el:20000338
Publication status	Published - 2000

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@article{77c358220fab4f2b933e64aaf857c5d8,

title = "Improved cryogenic sapphire oscillator with exceptionally high frequency stability",

abstract = "Extremely high short term frequency stability has been realised in oscillators based on liquid helium cooled sapphire resonators with a modified mounting structure. These oscillators have exhibited a fractional frequency stability (Allan deviation) of similar to 5.4 x 10(-16)tau(1/2) for integration times (a of 1-4s and a minimum Allan frequency deviation of 2.4 x 10(16) at 32s. For integration times greater than 100s the oscillator frequency stability degrades approximately as 3 x 10(-17)tau(1/2) This is the best stability reported to date for any frequency standard over integration times of 1-100s.",

author = "S. Chang and Anthony Mann and Andre Luiten",

year = "2000",

doi = "10.1049/el:20000338",

language = "English",

volume = "36",

pages = "480--481",

journal = "Electronics Letters",

issn = "0013-5194",

publisher = "Institution of Engineering and Technology",

number = "5",

}

TY - JOUR

T1 - Improved cryogenic sapphire oscillator with exceptionally high frequency stability

AU - Chang, S.

AU - Mann, Anthony

AU - Luiten, Andre

PY - 2000

Y1 - 2000

N2 - Extremely high short term frequency stability has been realised in oscillators based on liquid helium cooled sapphire resonators with a modified mounting structure. These oscillators have exhibited a fractional frequency stability (Allan deviation) of similar to 5.4 x 10(-16)tau(1/2) for integration times (a of 1-4s and a minimum Allan frequency deviation of 2.4 x 10(16) at 32s. For integration times greater than 100s the oscillator frequency stability degrades approximately as 3 x 10(-17)tau(1/2) This is the best stability reported to date for any frequency standard over integration times of 1-100s.

AB - Extremely high short term frequency stability has been realised in oscillators based on liquid helium cooled sapphire resonators with a modified mounting structure. These oscillators have exhibited a fractional frequency stability (Allan deviation) of similar to 5.4 x 10(-16)tau(1/2) for integration times (a of 1-4s and a minimum Allan frequency deviation of 2.4 x 10(16) at 32s. For integration times greater than 100s the oscillator frequency stability degrades approximately as 3 x 10(-17)tau(1/2) This is the best stability reported to date for any frequency standard over integration times of 1-100s.

U2 - 10.1049/el:20000338

DO - 10.1049/el:20000338

M3 - Article

SN - 0013-5194

VL - 36

SP - 480

EP - 481

JO - Electronics Letters

JF - Electronics Letters

IS - 5

ER -

Improved cryogenic sapphire oscillator with exceptionally high frequency stability

Abstract

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