High resolution CB diffraction in symmetry analysis at low temperatures

A. W. S. Johnson, P. Goodman, W. C. T. Dowell, D. Williams

Research output: Chapter in Book/Conference paper › Conference paper

Original language	English
Title of host publication	Proceedings of the 37th Annual Meeting Electron Microscopy Society of America
Editors	G. W. Bailey
Place of Publication	USA
Publisher	San Francisco Press
Publication status	Published - 1979
Externally published	Yes

Johnson, A. W. S., Goodman, P., Dowell, W. C. T., & Williams, D. (1979). High resolution CB diffraction in symmetry analysis at low temperatures. In G. W. Bailey (Ed.), Proceedings of the 37th Annual Meeting Electron Microscopy Society of America USA: San Francisco Press.

Johnson, A. W. S. ; Goodman, P. ; Dowell, W. C. T. ; Williams, D. / High resolution CB diffraction in symmetry analysis at low temperatures. Proceedings of the 37th Annual Meeting Electron Microscopy Society of America. editor / G. W. Bailey. USA : San Francisco Press, 1979.

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title = "High resolution CB diffraction in symmetry analysis at low temperatures",

author = "Johnson, {A. W. S.} and P. Goodman and Dowell, {W. C. T.} and D. Williams",

year = "1979",

language = "English",

editor = "Bailey, {G. W.}",

booktitle = "Proceedings of the 37th Annual Meeting Electron Microscopy Society of America",

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Johnson, AWS, Goodman, P, Dowell, WCT & Williams, D 1979, High resolution CB diffraction in symmetry analysis at low temperatures. in GW Bailey (ed.), Proceedings of the 37th Annual Meeting Electron Microscopy Society of America. San Francisco Press, USA.

Proceedings of the 37th Annual Meeting Electron Microscopy Society of America. ed. / G. W. Bailey. USA : San Francisco Press, 1979.

Research output: Chapter in Book/Conference paper › Conference paper

TY - GEN

T1 - High resolution CB diffraction in symmetry analysis at low temperatures

AU - Johnson, A. W. S.

AU - Goodman, P.

AU - Dowell, W. C. T.

AU - Williams, D.

PY - 1979

Y1 - 1979

M3 - Conference paper

BT - Proceedings of the 37th Annual Meeting Electron Microscopy Society of America

A2 - Bailey, G. W.

PB - San Francisco Press

CY - USA

ER -

Johnson AWS, Goodman P, Dowell WCT, Williams D. High resolution CB diffraction in symmetry analysis at low temperatures. In Bailey GW, editor, Proceedings of the 37th Annual Meeting Electron Microscopy Society of America. USA: San Francisco Press. 1979