High resolution CB diffraction in symmetry analysis at low temperatures

A. W. S. Johnson, P. Goodman, W. C. T. Dowell, D. Williams

Research output: Chapter in Book/Conference paperConference paper

Original languageEnglish
Title of host publicationProceedings of the 37th Annual Meeting Electron Microscopy Society of America
EditorsG. W. Bailey
Place of PublicationUSA
PublisherSan Francisco Press
Publication statusPublished - 1979
Externally publishedYes

Cite this

Johnson, A. W. S., Goodman, P., Dowell, W. C. T., & Williams, D. (1979). High resolution CB diffraction in symmetry analysis at low temperatures. In G. W. Bailey (Ed.), Proceedings of the 37th Annual Meeting Electron Microscopy Society of America USA: San Francisco Press.