High resolution CB diffraction in symmetry analysis at low temperatures

A. W. S. Johnson, P. Goodman, W. C. T. Dowell, D. Williams

Research output: Chapter in Book/Conference paperConference paper

Original languageEnglish
Title of host publicationProceedings of the 37th Annual Meeting Electron Microscopy Society of America
EditorsG. W. Bailey
Place of PublicationUSA
PublisherSan Francisco Press
Publication statusPublished - 1979
Externally publishedYes

Cite this

Johnson, A. W. S., Goodman, P., Dowell, W. C. T., & Williams, D. (1979). High resolution CB diffraction in symmetry analysis at low temperatures. In G. W. Bailey (Ed.), Proceedings of the 37th Annual Meeting Electron Microscopy Society of America USA: San Francisco Press.
Johnson, A. W. S. ; Goodman, P. ; Dowell, W. C. T. ; Williams, D. / High resolution CB diffraction in symmetry analysis at low temperatures. Proceedings of the 37th Annual Meeting Electron Microscopy Society of America. editor / G. W. Bailey. USA : San Francisco Press, 1979.
@inproceedings{ffd5d3860bb64a099b4d92b8df739ce3,
title = "High resolution CB diffraction in symmetry analysis at low temperatures",
author = "Johnson, {A. W. S.} and P. Goodman and Dowell, {W. C. T.} and D. Williams",
year = "1979",
language = "English",
editor = "Bailey, {G. W.}",
booktitle = "Proceedings of the 37th Annual Meeting Electron Microscopy Society of America",
publisher = "San Francisco Press",

}

Johnson, AWS, Goodman, P, Dowell, WCT & Williams, D 1979, High resolution CB diffraction in symmetry analysis at low temperatures. in GW Bailey (ed.), Proceedings of the 37th Annual Meeting Electron Microscopy Society of America. San Francisco Press, USA.

High resolution CB diffraction in symmetry analysis at low temperatures. / Johnson, A. W. S. ; Goodman, P.; Dowell, W. C. T.; Williams, D.

Proceedings of the 37th Annual Meeting Electron Microscopy Society of America. ed. / G. W. Bailey. USA : San Francisco Press, 1979.

Research output: Chapter in Book/Conference paperConference paper

TY - GEN

T1 - High resolution CB diffraction in symmetry analysis at low temperatures

AU - Johnson, A. W. S.

AU - Goodman, P.

AU - Dowell, W. C. T.

AU - Williams, D.

PY - 1979

Y1 - 1979

M3 - Conference paper

BT - Proceedings of the 37th Annual Meeting Electron Microscopy Society of America

A2 - Bailey, G. W.

PB - San Francisco Press

CY - USA

ER -

Johnson AWS, Goodman P, Dowell WCT, Williams D. High resolution CB diffraction in symmetry analysis at low temperatures. In Bailey GW, editor, Proceedings of the 37th Annual Meeting Electron Microscopy Society of America. USA: San Francisco Press. 1979