Original language | English |
---|---|
Title of host publication | Proceedings of the 37th Annual Meeting Electron Microscopy Society of America |
Editors | G. W. Bailey |
Place of Publication | USA |
Publisher | San Francisco Press |
Publication status | Published - 1979 |
Externally published | Yes |
Cite this
Johnson, A. W. S., Goodman, P., Dowell, W. C. T., & Williams, D. (1979). High resolution CB diffraction in symmetry analysis at low temperatures. In G. W. Bailey (Ed.), Proceedings of the 37th Annual Meeting Electron Microscopy Society of America USA: San Francisco Press.
@inproceedings{ffd5d3860bb64a099b4d92b8df739ce3,
title = "High resolution CB diffraction in symmetry analysis at low temperatures",
author = "Johnson, {A. W. S.} and P. Goodman and Dowell, {W. C. T.} and D. Williams",
year = "1979",
language = "English",
editor = "Bailey, {G. W.}",
booktitle = "Proceedings of the 37th Annual Meeting Electron Microscopy Society of America",
publisher = "San Francisco Press",
}
Johnson, AWS, Goodman, P, Dowell, WCT & Williams, D 1979, High resolution CB diffraction in symmetry analysis at low temperatures. in GW Bailey (ed.), Proceedings of the 37th Annual Meeting Electron Microscopy Society of America. San Francisco Press, USA.
High resolution CB diffraction in symmetry analysis at low temperatures. / Johnson, A. W. S. ; Goodman, P.; Dowell, W. C. T.; Williams, D.
Proceedings of the 37th Annual Meeting Electron Microscopy Society of America. ed. / G. W. Bailey. USA : San Francisco Press, 1979.Research output: Chapter in Book/Conference paper › Conference paper
TY - GEN
T1 - High resolution CB diffraction in symmetry analysis at low temperatures
AU - Johnson, A. W. S.
AU - Goodman, P.
AU - Dowell, W. C. T.
AU - Williams, D.
PY - 1979
Y1 - 1979
M3 - Conference paper
BT - Proceedings of the 37th Annual Meeting Electron Microscopy Society of America
A2 - Bailey, G. W.
PB - San Francisco Press
CY - USA
ER -
Johnson AWS, Goodman P, Dowell WCT, Williams D. High resolution CB diffraction in symmetry analysis at low temperatures. In Bailey GW, editor, Proceedings of the 37th Annual Meeting Electron Microscopy Society of America. USA: San Francisco Press. 1979