High resolution CB diffraction in symmetry analysis at low temperatures

A. W. S. Johnson, P. Goodman, W. C. T. Dowell, D. Williams

Research output: Chapter in Book/Conference paper › Conference paper

Original language	English
Title of host publication	Proceedings of the 37th Annual Meeting Electron Microscopy Society of America
Editors	G. W. Bailey
Place of Publication	USA
Publisher	San Francisco Press
Publication status	Published - 1979
Externally published	Yes

Cite this

Johnson, A. W. S., Goodman, P., Dowell, W. C. T., & Williams, D. (1979). High resolution CB diffraction in symmetry analysis at low temperatures. In G. W. Bailey (Ed.), Proceedings of the 37th Annual Meeting Electron Microscopy Society of America USA: San Francisco Press.

@inproceedings{ffd5d3860bb64a099b4d92b8df739ce3,

title = "High resolution CB diffraction in symmetry analysis at low temperatures",

author = "Johnson, {A. W. S.} and P. Goodman and Dowell, {W. C. T.} and D. Williams",

year = "1979",

language = "English",

editor = "Bailey, {G. W.}",

booktitle = "Proceedings of the 37th Annual Meeting Electron Microscopy Society of America",

publisher = "San Francisco Press",

}