High resolution CB diffraction in symmetry analysis at low temperatures

A. W. S. Johnson, P. Goodman, W. C. T. Dowell, D. Williams

Research output: Chapter in Book/Conference paperConference paper

Original languageEnglish
Title of host publicationProceedings of the 37th Annual Meeting Electron Microscopy Society of America
EditorsG. W. Bailey
Place of PublicationUSA
PublisherSan Francisco Press
Publication statusPublished - 1979
Externally publishedYes

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