High Q-factor distributed Bragg reflector resonators with reflectors of arbitrary thickness

J.G. Le Floch, Michael Tobar, D. Cros, J. Krupka

Research output: Contribution to journalArticlepeer-review

11 Citations (Scopus)


The Bragg reflection technique improves the Q-factor of a resonator by reducing conductor and dielectric losses. This is achieved by designing a low-loss inner resonant region (usually free space) surrounded by an outer anti-resonant region made of distributed Bragg reflector layers. In this paper we develop a simple non-Maxwellian model and apply it to design three distinct cylindrical Bragg resonators based on the same set of single-crystal sapphire plates and rings by changing only the dimension of the cavity that supports the structure. To accomplish this, the simple model allows an arbitrary thickness for either the horizontal or the cylindrical dielectric reflectors by relaxing the condition that they must be lambda/4 thick. The model also allows for higher-order field variations in both the resonant and the anti-resonant regions. The resonators were constructed and experimental results were compared with the simple model and the rigorous method of lines analysis. For the fundamental mode, an unloaded Q-factor of 234,000 at 9.7 GHz was obtained. This is larger than that for a whispering gallery mode resonator. The resonator also exhibited a greatly reduced spurious mode density when compared to an overmoded whispering gallery mode resonator.
Original languageEnglish
Pages (from-to)2689-2695
JournalIEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control
Issue number12
Publication statusPublished - 2007


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