Growth and XPS Characterization of Anodic Telluride Films on Hg1-xCdxTe

M. Jain, B.D. Nener, N. Warrington, Murray Baker, J.L. Robins, L. Faraone

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

An anodic tellurization process to grow native telluride films on Hg1-xCdxTe is described. This process requires two steps: first the growth of an anodic sulfide/oxide film and second the conversion of this film into an anodic telluride film. XPS studies suggest that the total conversion of the anodic sulfide/oxide film into an anodic telluride film is possible. The concentration of tellurium in the anodically grown telluride films can be controlled by controlling the concentration of sulfur and oxygen in the starting film.
Original languageEnglish
Pages (from-to)2480-2485
JournalJournal of the Electrochemical Society
Volume142
DOIs
Publication statusPublished - 1995

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