Growth and XPS Characterisation of Anodic Telluride Films on HgCdTe

M. Jain, Brett Nener, N. Warrington, M.V. Baker, J.L. Robins, Lorenzo Faraone

Research output: Contribution to journal › Article

Original language	English
Pages (from-to)	2480-2485
Journal	Journal of the Electrochemical Society
Volume	142
Issue number	7
Publication status	Published - 1995

Cite this

@article{a040c2ced8b6445081db85860e6f77d5,

title = "Growth and XPS Characterisation of Anodic Telluride Films on HgCdTe",

author = "M. Jain and Brett Nener and N. Warrington and M.V. Baker and J.L. Robins and Lorenzo Faraone",

year = "1995",

language = "English",

volume = "142",

pages = "2480--2485",

journal = "Journal of the Electrochemical Society",

issn = "0013-4651",

publisher = "ELECTROCHEMICAL SOC INC",

number = "7",

}

TY - JOUR

T1 - Growth and XPS Characterisation of Anodic Telluride Films on HgCdTe

AU - Jain, M.

AU - Nener, Brett

AU - Warrington, N.

AU - Baker, M.V.

AU - Robins, J.L.

AU - Faraone, Lorenzo

PY - 1995

Y1 - 1995

M3 - Article

VL - 142

SP - 2480

EP - 2485

JO - Journal of the Electrochemical Society

JF - Journal of the Electrochemical Society

SN - 0013-4651

IS - 7

ER -