Generic flaw detection within images

P.S. Williams, Michael Alder

Research output: Chapter in Book/Conference paperConference paperpeer-review

2 Citations (Scopus)
Original languageEnglish
Title of host publication1995 IEEE International Conference on Neural Networks Proceedings
EditorsM. Palaniswami
Place of PublicationPerth
PublisherIEEE, Institute of Electrical and Electronics Engineers
Pages141-145
Volume1
EditionPerth, Western Australia
ISBN (Print)0780327683
Publication statusPublished - 1995
EventGeneric flaw detection within images - Perth, Western Australia
Duration: 1 Jan 1995 → …

Conference

ConferenceGeneric flaw detection within images
Period1/01/95 → …

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