Generic flaw detection within images

P.S. Williams, Michael Alder

Research output: Chapter in Book/Conference paperConference paperpeer-review

2 Citations (Scopus)
Original languageEnglish
Title of host publication1995 IEEE International Conference on Neural Networks Proceedings
EditorsM. Palaniswami
Place of PublicationPerth
PublisherIEEE, Institute of Electrical and Electronics Engineers
EditionPerth, Western Australia
ISBN (Print)0780327683
Publication statusPublished - 1995
EventGeneric flaw detection within images - Perth, Western Australia
Duration: 1 Jan 1995 → …


ConferenceGeneric flaw detection within images
Period1/01/95 → …

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