TY - JOUR
T1 - Fractional-order three-dimensional × n circuit network
AU - Zhou, K.
AU - Chen, D.
AU - Zhang, X.
AU - Zhou, R.
AU - Iu, Ho Ching
PY - 2015
Y1 - 2015
N2 - © 2015 IEEE. This paper introduces new fundamentals of the three-dimensional × n RLC circuit network in the fractional- order domain. First, we derive the general formula of the typical equivalent impedance of the circuit network in different cases by using matrix transform method and the difference equation model. Then, we systematically investigate the effects of the five system parameters (inductance (L), capacitance (C), the number of circuit units (n), and fractional orders α and β) on the impendence characteristics and the phase characteristics of two different cases. Specifically, interesting phenomena and laws are presented by the numerical simulations. Moreover, a comparative analysis about the impendence characteristics and the phase characteristics of the two cases for the fractional-order three-dimensional circuit network is studied in detail. Finally, the results of PSpice simulation are presented to validate the study.
AB - © 2015 IEEE. This paper introduces new fundamentals of the three-dimensional × n RLC circuit network in the fractional- order domain. First, we derive the general formula of the typical equivalent impedance of the circuit network in different cases by using matrix transform method and the difference equation model. Then, we systematically investigate the effects of the five system parameters (inductance (L), capacitance (C), the number of circuit units (n), and fractional orders α and β) on the impendence characteristics and the phase characteristics of two different cases. Specifically, interesting phenomena and laws are presented by the numerical simulations. Moreover, a comparative analysis about the impendence characteristics and the phase characteristics of the two cases for the fractional-order three-dimensional circuit network is studied in detail. Finally, the results of PSpice simulation are presented to validate the study.
U2 - 10.1109/TCSI.2015.2469031
DO - 10.1109/TCSI.2015.2469031
M3 - Article
VL - 62
SP - 2401
EP - 2410
JO - IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS-I : REGULAR PAPERS
JF - IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS-I : REGULAR PAPERS
SN - 1549-8328
IS - 10
ER -