Fabry-Pérot MEMS microspectrometers spanning the SWIR and MWIR

Adrian J. Keating, Jarek Antoszewski, Konkaduwa K.M.B.D. Silva, Kevin J. Winchester, Thuyen Nguyen, John M. Dell, Charles A. Musca, Lorenzo Faraone, Olivia Samardzic

Research output: Chapter in Book/Conference paperConference paperpeer-review

4 Citations (Scopus)

Abstract

We have previously developed a SWIR microspectrometer based on monolithic integration of a parallel plate Micro-Electro-Mechanical Systems (MEMS) optical filter directly with a HgxCd1-xTe-based infrared detector. The primary technical challenge in achieving the integration of a MEMS Fabry-Pérot filter with the HgxCd1-xTe detector is to keep the processing temperature less than 150°C, as the performance of HgxCd1-xTe based photoconductors degrade at higher process temperatures. In this work we present our results to extend the operation into the 3-5 μm (MWIR) wavelength range. For our preliminary results, the MWIR microspectrometer was based on a hybrid packaging approach, fabricating the MWIR filter separately from the HgxCd1-xTe detector; however the key process parameters relating to temperature control were maintained during fabrication of the MWIR filter, ensuring we can migrate this technology into an integrated solution. Linewidths of 210 nm, switching times of 20 μs and a tuning range of 900 nm have been achieved. The tuning speed is limited by squeezed film damping due to the physically narrow gap (λ/2) between the Fabry-Pérot mirrors.

Original languageEnglish
Title of host publicationProceedings of SPIE - Infrared Technology and Applications XXXIII
EditorsBjørn F. Andresen, Gabor F. Fulop, Paul R. Norton
Place of PublicationUnited States of America
PublisherSPIE
Volume6542
EditionOrlando, Florida, USA
ISBN (Print)0819466646, 9780819466648
DOIs
Publication statusPublished - 2007
EventInfrared Technology and Applications XXXIII - Orlando, FL, United States
Duration: 9 Apr 200713 Apr 2007

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume6542
ISSN (Print)0277-786X

Conference

ConferenceInfrared Technology and Applications XXXIII
Country/TerritoryUnited States
CityOrlando, FL
Period9/04/0713/04/07

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