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We describe the use of digital phase noise test sets at frequencies well beyond the sampling rate of their analog-to-digital converters. The technique proposed involves the transfer of phase fluctuations from an arbitrary high carrier frequency to within the operating frequency range of the digital instrument. The validity of the proposed technique has been proven via comparison with conventional methods. Digital noise measurements eliminate the need for calibration and improve consistency of experimental results. Mechanisms limiting the resolution of spectral measurements are also discussed. © 2014 IEEE.
|Number of pages||5|
|Journal||IEEE Transactions on Microwave Theory and Techniques|
|Early online date||19 Dec 2013|
|Publication status||Published - 3 Feb 2014|
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Hartnett, J., Park, S. E., Lee, S. & Santarelli, G.
1/01/11 → 31/12/11