Extending the frequency range of digital noise measurements to the microwave domain

Stephen Parker, Eugene Ivanov, John Hartnett

    Research output: Contribution to journalArticle

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    Abstract

    We describe the use of digital phase noise test sets at frequencies well beyond the sampling rate of their analog-to-digital converters. The technique proposed involves the transfer of phase fluctuations from an arbitrary high carrier frequency to within the operating frequency range of the digital instrument. The validity of the proposed technique has been proven via comparison with conventional methods. Digital noise measurements eliminate the need for calibration and improve consistency of experimental results. Mechanisms limiting the resolution of spectral measurements are also discussed. © 2014 IEEE.
    Original languageEnglish
    Pages (from-to)368-372
    Number of pages5
    JournalIEEE Transactions on Microwave Theory and Techniques
    Volume62
    Issue number2
    Early online date19 Dec 2013
    DOIs
    Publication statusPublished - 3 Feb 2014

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