Experimental evaluation of latency coding for gas recognition

J.H.J. Al Yamani, Farid Boussaid, A. Bermak, D. Martinez

Research output: Chapter in Book/Conference paper › Conference paper

Original language	English
Title of host publication	8th IEEE International Design and Test Symposium (IDT)
Place of Publication	United States
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	4 pp.
ISBN (Print)	9781479935253
DOIs	https://doi.org/10.1109/IDT.2013.6727123
Publication status	Published - 2013
Event	2013 8th IEEE Design and Test Symposium - Marrakech, Morocco Duration: 16 Dec 2013 → 18 Dec 2013

Conference	2013 8th IEEE Design and Test Symposium
Country	Morocco
City	Marrakech
Period	16/12/13 → 18/12/13

Access to Document

@inproceedings{f82f9d9a65724ef388323bb2bc0404cf,

title = "Experimental evaluation of latency coding for gas recognition",

author = "{Al Yamani}, J.H.J. and Farid Boussaid and A. Bermak and D. Martinez",

year = "2013",

doi = "10.1109/IDT.2013.6727123",

language = "English",

isbn = "9781479935253",

pages = "4 pp.",

booktitle = "8th IEEE International Design and Test Symposium (IDT)",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

address = "United States",

note = "2013 8th IEEE Design and Test Symposium ; Conference date: 16-12-2013 Through 18-12-2013",

}

Al Yamani, JHJ, Boussaid, F, Bermak, A & Martinez, D 2013, Experimental evaluation of latency coding for gas recognition. in 8th IEEE International Design and Test Symposium (IDT). IEEE, Institute of Electrical and Electronics Engineers, United States, pp. 4 pp., 2013 8th IEEE Design and Test Symposium, Marrakech, Morocco, 16/12/13. https://doi.org/10.1109/IDT.2013.6727123

TY - GEN

T1 - Experimental evaluation of latency coding for gas recognition

AU - Al Yamani, J.H.J.

AU - Boussaid, Farid

AU - Bermak, A.

AU - Martinez, D.

PY - 2013

Y1 - 2013

U2 - 10.1109/IDT.2013.6727123

DO - 10.1109/IDT.2013.6727123

M3 - Conference paper

SN - 9781479935253

SP - 4 pp.

BT - 8th IEEE International Design and Test Symposium (IDT)

PB - IEEE, Institute of Electrical and Electronics Engineers

CY - United States

T2 - 2013 8th IEEE Design and Test Symposium

Y2 - 16 December 2013 through 18 December 2013

ER -