Experimental evaluation of latency coding for gas recognition

J.H.J. Al Yamani, Farid Boussaid, A. Bermak, D. Martinez

Research output: Chapter in Book/Conference paper › Conference paper › peer-review

Original language	English
Title of host publication	8th IEEE International Design and Test Symposium (IDT)
Place of Publication	United States
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	4 pp.
ISBN (Print)	9781479935253
DOIs	https://doi.org/10.1109/IDT.2013.6727123
Publication status	Published - 2013
Event	2013 8th IEEE Design and Test Symposium - Marrakech, Morocco Duration: 16 Dec 2013 → 18 Dec 2013

Conference	2013 8th IEEE Design and Test Symposium
Country/Territory	Morocco
City	Marrakech
Period	16/12/13 → 18/12/13

Access to Document

@inproceedings{f82f9d9a65724ef388323bb2bc0404cf,

title = "Experimental evaluation of latency coding for gas recognition",

author = "{Al Yamani}, J.H.J. and Farid Boussaid and A. Bermak and D. Martinez",

year = "2013",

doi = "10.1109/IDT.2013.6727123",

language = "English",

isbn = "9781479935253",

pages = "4 pp.",

booktitle = "8th IEEE International Design and Test Symposium (IDT)",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

address = "United States",

note = "2013 8th IEEE Design and Test Symposium ; Conference date: 16-12-2013 Through 18-12-2013",

}

Al Yamani, JHJ, Boussaid, F, Bermak, A & Martinez, D 2013, Experimental evaluation of latency coding for gas recognition. in 8th IEEE International Design and Test Symposium (IDT). IEEE, Institute of Electrical and Electronics Engineers, United States, pp. 4 pp., 2013 8th IEEE Design and Test Symposium, Marrakech, Morocco, 16/12/13. https://doi.org/10.1109/IDT.2013.6727123

TY - GEN

T1 - Experimental evaluation of latency coding for gas recognition

AU - Al Yamani, J.H.J.

AU - Boussaid, Farid

AU - Bermak, A.

AU - Martinez, D.

PY - 2013

Y1 - 2013

U2 - 10.1109/IDT.2013.6727123

DO - 10.1109/IDT.2013.6727123

M3 - Conference paper

SN - 9781479935253

SP - 4 pp.

BT - 8th IEEE International Design and Test Symposium (IDT)

PB - IEEE, Institute of Electrical and Electronics Engineers

CY - United States

T2 - 2013 8th IEEE Design and Test Symposium

Y2 - 16 December 2013 through 18 December 2013

ER -