Exchange Bias: Interface Imperfections and Temperature Dependence

J-V. Kim, Leonard Wee, Robert Stamps, Robert Street

Research output: Contribution to journal › Article › peer-review

10 Citations (Scopus)

Original language	English
Pages (from-to)	2994-2997
Journal	Institute of Electrical and Electronics Engineers Transactions on Magnetics
Volume	35
Issue number	5
DOIs	https://doi.org/10.1109/20.801063
Publication status	Published - 1999

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@article{7b829c78f8e84c04a36779d816b4d865,

title = "Exchange Bias: Interface Imperfections and Temperature Dependence",

author = "J-V. Kim and Leonard Wee and Robert Stamps and Robert Street",

year = "1999",

doi = "10.1109/20.801063",

language = "English",

volume = "35",

pages = "2994--2997",

journal = "Institute of Electrical and Electronics Engineers Transactions on Magnetics",

issn = "0018-9464",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

number = "5",

}

TY - JOUR

T1 - Exchange Bias: Interface Imperfections and Temperature Dependence

AU - Kim, J-V.

AU - Wee, Leonard

AU - Stamps, Robert

AU - Street, Robert

PY - 1999

Y1 - 1999

U2 - 10.1109/20.801063

DO - 10.1109/20.801063

M3 - Article

SN - 0018-9464

VL - 35

SP - 2994

EP - 2997

JO - Institute of Electrical and Electronics Engineers Transactions on Magnetics

JF - Institute of Electrical and Electronics Engineers Transactions on Magnetics

IS - 5

ER -